Results 1 to 10 of about 86,576 (325)

Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts [PDF]

Vitor A. P. Aguiar, Saulo G. Alberton, Matheus S. Pereira   +2 more
openalex   +1 more source

Increasing the reliability of wind turbines using condition monitoring of semiconductor devices: a review

, 2017
Rana Moeini, Pietro Tricoli, Hassan Hemida, Charalampos Baniotopoulos   +3 more
openalex   +2 more sources

Study of high voltage solar array configurations with integrated power control electronics [PDF]

Solar array electrical configurations for voltage ...
Ebersole, T., Hayden, J. H., Rasmussen, R., Weiner, P.   +3 more
core   +1 more source

Enhancement of Thermal Boundary Conductance between MoS2 and Dielectric Layer by Self‐Assembled Monolayers

Advanced Electronic Materials
The 2D semiconductor monolayer MoS2 is expected to be a potential channel material to achieve higher miniaturization and integration in post‐Moore era due to its exceptional electrical and optical properties.
Jian Huang, Xiaotong Yu, Xiaofeng Wang, Fanfan Wang, Zexin Liu, Kai Yang, Yue Yue, Kangyong Li, Ruiwen Dai, Aming Lin, Yiyang Sun, Tianlong Zhao, Zhiqiang Wang, Yuan Gao, Lifu Zhang, Dongdong Chen, Guoqing Xin   +16 more
doaj   +1 more source

Historical Overview of Semiconductor Device Reliability for Telecommunication Networks––Field Data, Prediction Model of Device Failure Rate, and Wear-out Failure Analyses at NTT [PDF]

, 2013
Noboru Shiono, Eisuke Arai, S. Mutoh
openalex   +1 more source

Graphene-based optical modulators for next generation datacom

, 2019
C
Alessandri, Chiara, Asselberghs, Inge, Brems, Steven, Huygebaert, Cedric, Pantouvaki, Marianne, Van Campenhout, Joris, Van Thourhout, Dries   +6 more
core   +1 more source

Contamination Free Manufacturing of Semiconductor Devices for High Reliability [PDF]

, 2008
Jagdish Prasad
openalex   +1 more source

Reliability Design of Thin Film Processes for Semiconductor Devices

, 1995
Michihiro Watanabe, Hideo Miura
openalex   +2 more sources

Behavior of Space Charge in Polyimide and the Influence on Power Semiconductor Device Reliability

, 2020
K. Tajiri, Hirotaka Muto, Didier Marty‐Dessus, Laurent Berquez, G. Teyssèdre, Marie‐Laure Locatelli, Sombel Diaham, V. Griseri, Flora Carrasco   +8 more
openalex   +2 more sources

AI-driven quantitative review of mobility-stability trade-off in oxide semiconductors. [PDF]

Nano Converg
Hong JH, Lee CH, Kim HW, Jeon DW, Kang JH, Kim YS, Bae JS, Heo S, Lee S, Na J, You J, Hong S, Cho H, Park JS, Cho SB.   +14 more
europepmc   +1 more source