Results 51 to 60 of about 2,771,177 (302)

Chromatic dispersion monitoring of 80-Gb/s OTDM data signal via two-photon absorption in a semiconductor microcavity [PDF]

, 2007
In this letter, a novel method of chromatic dispersion monitoring via two-photon absorption (TPA) is investigated. A specially designed semiconductor microcavity is employed as a TPA detector for monitoring data signals operating at rates up to 80Gb/s ...
Guo, Wei Hua, O\u27Dowd, John, O'Dowd, John, Donegan, John Francis, Folliot, Hervé, Donegan, J.F., O'Dowd, J., Bradley, A.L., Guo, W.H., Maguire, P. J., Folliot, H., Lynch, M., Barry, Liam P., Bondarczuk, Krzysztof, Lynch, Michael, Barry, L.P., Bondarczuk, K., Bradley, Ann Louise, Maguire, Paul J.   +18 more
core   +2 more sources

Metal surface passivation in semiconductor processing of Mo, W, TiN/TiSiN, and Cu: emerging strategies for corrosion and etching control

Materials & Design
Wet cleaning, a critical step in semiconductor manufacturing, is essential for device reliability but can induce metal corrosion due to the aggressive chemical solutions used, becoming a primary cause of yield degradation.
Yejin Lee, Suyeon Bae, Jee Woo Kim, Byungjoon Kang, Sungmin Kim, Jina Kim, Insun Park, Kyu Young Hwang, Byung-Kwon Kim   +8 more
doaj   +1 more source

Chemical State Detection and Charge Transfer in Complex Oxide Heterostructures via In Situ Auger Electron Spectroscopy

Advanced Functional Materials, EarlyView.
In situ Auger Electron Spectroscopy resolves oxidation states with high fidelity during the pulsed laser deposition of multivalent perovskite manganate and vanadate heterostructures. The chemical‐state signature is carried by the valence‐electron population of the transition‐metal cation, read out through the relative intensities of Auger fine ...
Harish Kumarasubramanian, Jayakanth Ravichandran   +1 more
wiley   +1 more source

A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty

IET Power Electronics
Different methods have been developed to predict power devices' remaining useful life (RUL). The existing methods need to specify the failure thresholds corresponding to failure precursors of power devices based on historical data.
Qunfang Wu, Boyuan Xu, Lan Xiao, Qin Wang   +3 more
doaj   +1 more source

Advances in Sustainable and Wearable Textile Based Soft Robotics

Advanced Functional Materials, EarlyView.
This Review examines advances in wearable textile‐based soft robotics, focusing on sustainable materials, integrated sensing, and scalable actuation. It discusses manufacturing and system integration across healthcare, assistive robotics, prosthetics, and human–machine interfaces, and highlights key challenges in circular design, including life‐cycle ...
Zahir Abbas, Marzia Dulal, Sophia K. Novoselov, Victoria K. Novoselov, Kostya S. Novoselov, Shaila Afroj, Nazmul Karim   +6 more
wiley   +1 more source

The reliability of the power semiconductor module on the operating temperature

MATEC Web of Conferences, 2014
A comparison of the intensities of the failure of a power unit with the real thermal regime of the device under conditions of natural convection and obtained by using statistical data analysis.
Kravchenko Evgeny V., Ivleva Dariya Yu.
doaj   +1 more source

Soft-switching SiC power electronic conversion for distributed energy resources and storage applications

Journal of Modern Power Systems and Clean Energy, 2019
Power electronic conversion plays an important role in flexible AC or DC transmission and distribution systems, integration of renewable energy resources, and energy storage systems to enhance efficiency, controllability, stability, and reliability of ...
Keyan Shi, Jinyi Deng, An Zhao, Dehong Xu   +3 more
doaj   +1 more source

Research on Test Method of Ignition Temperature of Electric Explosive Device under Electromagnetic Pulse [PDF]

Radioengineering, 2021
The safety and reliability of electric explosive device, as the most sensitive initiating energy for igniting powder and explosive, directly impact those of weapon system. The safety and reliability of the electric explosion device were determined by the
B. Wang, Y. W. Sun, G. G. Wei, X. T. Wang, H. M. Gao   +4 more
doaj  

Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton implantation to solve bipolar degradation

Scientific Reports, 2022
4H-SiC has been commercialized as a material for power semiconductor devices. However, the long-term reliability of 4H-SiC devices is a barrier to their widespread application, and the most important reliability issue in 4H-SiC devices is bipolar ...
Masashi Kato, Ohga Watanabe, Toshiki Mii, Hitoshi Sakane, Shunta Harada   +4 more
doaj   +1 more source

Monolithic Oxidation Enables Ultrathin Vertically Graded Tantalum Oxide for Low‐Voltage, Low‐Variability Memristive Switching

Advanced Functional Materials, EarlyView.
Monolithic UV‐ozone oxidation of Ta forms an ultrathin Ta2O5/TaOx bilayer enabling resistive switching with a vertical defect gradient. A stoichiometric surface layer over an oxygen‐deficient sublayer promotes localized filament nucleation near the top interface, enabling low‐voltage operation, and reduced cycle‐to‐cycle variability.
Seunghoon Yang, Dong Hyun Lee, Conan Weiland, Won‐Il Lee, Kim Kisslinger, Mingzhao Liu, Aswin kumar Anbalagan, Xiao Tong, Soumyajit Mandal, Nikhil Tiwale, Houk Jang, Chang‐Yong Nam   +11 more
wiley   +1 more source