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Adaptive reinforcement learning for lithography optimization: a scalable AI-driven solution for next-generation semiconductor manufacturing [PDF]

open access: yesScientific Reports
Semiconductor lithography, a pivotal process in integrated circuit (IC) fabrication, accounts for approximately 30% of production costs and faces significant challenges as feature sizes shrink to sub-nanometer scales.
Umar Rashid   +5 more
doaj   +2 more sources

Two-photon states meet polarization-gradient metasurfaces for nanometric, low-dose lateral-displacement metrology [PDF]

open access: yesLight: Science & Applications
Accurate displacement sensing is indispensable in advanced semiconductor lithography. Conventional coherent-light-based approaches are hindered by photon budget limitations, slowing down in-situ measurements. In a recent study, Chen et al.
Qian-Mei Deng   +3 more
doaj   +2 more sources

Meta-device for sensing subwavelength lateral displacement [PDF]

open access: yesLight: Science & Applications
Accurate transverse displacement measurement is essential for precise mask-to-wafer positioning in lithography. While lateral displacement metrology has achieved nanometer-level precision, the limitations imposed by coherent state and grating challenge ...
Shufan Chen   +7 more
doaj   +2 more sources

Inverse Lithography Technology (ILT) Under Chip Manufacture Context [PDF]

open access: yesMicromachines
As semiconductor process nodes shrink to 3 nm and beyond, traditional optical proximity correction (OPC) and resolution enhancement technologies (RETs) can no longer meet the high patterning precision needs of advanced chip manufacturing due to the sub ...
Xiaodong Meng, Cai Chen, Jie Ni
doaj   +2 more sources

Green Nanofabrication Opportunities in the Semiconductor Industry: A Life Cycle Perspective

open access: yesNanomaterials, 2021
The turn of the 21st century heralded in the semiconductor age alongside the Anthropocene epoch, characterised by the ever-increasing human impact on the environment.
Eleanor Mullen, Michael A. Morris
doaj   +1 more source

Lithography Alignment Techniques Based on Moiré Fringe

open access: yesPhotonics, 2023
In Moiré fringe lithography alignment technology, alignment is realized by monitoring the grating interference fringe image in real-time. The technique exhibits excellent sensitivity to displacement changes and is not easily affected by the gap changes ...
Wenbo Jiang   +3 more
doaj   +1 more source

Possibility of Benzene Exposure in Workers of a Semiconductor Industry Based on the Patent Resources, 1990–2010

open access: yesSafety and Health at Work, 2021
Background: This study aimed to assess the possibility of benzene exposure in workers of a Korean semiconductor manufacturing company by reviewing the issued patents.
Sangjun Choi, Donguk Park, Yunkyung Park
doaj   +1 more source

Analysis of the Cylindrical Flexure Hinges with Circular Notches [PDF]

open access: yes한국정밀공학회지, 2022
Flexure hinges are widely used as joint linkages for precision stages applied to lithography processes. Among them, precision stages with 3 DOF (Degrees of Freedom) of x, y and θz prevail in semiconductor manufacturing and they have been adopting single ...
Jun-Hee Moon
doaj   +1 more source

Large-area metasurface on CMOS-compatible fabrication platform: driving flat optics from lab to fab

open access: yesNanophotonics, 2020
A metasurface is a layer of subwavelength-scale nanostructures that can be used to design functional devices in ultrathin form. Various metasurface-based optical devices – coined as flat optics devices – have been realized with distinction performances ...
Li Nanxi   +7 more
doaj   +1 more source

Recent Advances in Organic-inorganic Hybrid Photoresists

open access: yesJournal of Microelectronic Manufacturing, 2021
Photoresists are radiation-sensitive materials used for forming patterns to build up IC devices. To date, most photoresists have been based on organic polymers, which have been dominating the semiconductor industries over the past few decades.
Zhihao Wang   +10 more
doaj   +1 more source

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