Results 221 to 230 of about 11,779 (261)
Some of the next articles are maybe not open access.
Optical metrology of semiconductor wafers in lithography
SPIE Proceedings, 2013This paper presents a concise description of 3 optical measurement systems that play a critical role in optical lithography of semiconductor devices. A level sensor and alignment sensor are described that are used to measure, respectively, wafer height variations and the wafer location prior to resist exposure.
openaire +1 more source
Diagnostics and lithography of semiconductor structures for nanoelectronics
Nanotechnologies in Russia, 2008A complex of metrological, diagnostic, and technological support of investigations and innovations in the field of nanotechnologies based on the Nanostructures joint service center is presented. Results of the study of the atomic structure of the surface, interfaces, and structural defects in semiconductor materials; the development of modern electron ...
openaire +1 more source
EUV LITHOGRAPHY FOR SEMICONDUCTOR MANUFACTURING AND NANOFABRICATION
COSMOS, 2007EUV lithography is the exposure technology in which even 15 nm node which is the limit of Si device can be achieved. Unlike the conventional optical lithography, this technology serves as a reflection type optical system, and a multilayer coated mirror is used.
openaire +1 more source
Semiconductor-, Lithography-, and Electrically-Related Applications
1999Electron-beam (e-beam) lithography has over the past 15 years or so taken a predominant role in Si wafer patterning in the semiconductor industry due to its sub-micron (and potential nano-scale) resolution. This high resolution and the accurate focussing of e-beams is however limited by charging which occurs in the photo-resist: a trapping of charge ...
openaire +1 more source
Projection exposure apparatus for semiconductor lithography
2021HARTJES JOACHIM +2 more
openaire +7 more sources
Universal Block Copolymer Lithography for Metals, Semiconductors, Ceramics, and Polymers
Advanced Materials, 2008Bong Hoon Kim +2 more
exaly
Semiconductor lithography for the next millennium
Microelectronics Reliability, 1997openaire +1 more source

