Results 11 to 20 of about 3,859 (261)

Preparation of a Photoluminescent Film on a Silicon-On-Insulator Device for the Simple, Rapid, and Quantitative Detection of a Hydatid Disease Diagnostic Protein Marker

open access: yesIEEE Photonics Journal, 2017
A silicon-on-insulator (SOI) device is an important integrated circuit technology containing an insulating material. In this paper, an SOI wafer consisting of n-type silicon grown on the surface of a SiO2 layer was adopted.
Xiaoyi Lv   +6 more
doaj   +1 more source

Fabrication and characterization of silicon-on-insulator wafers

open access: yesMicro and Nano Systems Letters, 2023
Silicon-on-insulator (SOI) wafers offer significant advantages for both Integrated circuits (ICs) and microelectromechanical systems (MEMS) devices with their buried oxide layer improving electrical isolation and etch stop function.
Taeyeong Kim, Jungchul Lee
doaj   +1 more source

Design Technology Co-Optimization Strategy for Ge Fraction in SiGe Channel of SGOI FinFET

open access: yesNanomaterials, 2023
FinFET devices and Silicon-On-Insulator (SOI) devices are two mainstream technical routes after the planar MOSFET reached the limit for scaling. The SOI FinFET devices combine the benefits of FinFET and SOI devices, which can be further boosted by SiGe ...
Shixin Li, Zhenhua Wu
doaj   +1 more source

Peculiarities of electronic structure of silicon-on-insulator structures and their interaction with synchrotron radiation

open access: yesModern Electronic Materials, 2015
SOI (silicon-on-insulator) structures with strained and unstrained silicon layers were studied by ultrasoft X-ray emission spectroscopy and X-ray absorption near edge structure spectroscopy with the use of synchrotron radiation techniques.
Vladimir A. Terekhov   +5 more
doaj   +1 more source

Strong Electro-Absorption in GeSi Epitaxy on Silicon-on-Insulator (SOI) [PDF]

open access: yesMicromachines, 2012
We have investigated the selective epitaxial growth of GeSi bulk material on silicon-on-insulator substrates by reduced pressure chemical vapor deposition. We employed AFM, SIMS, and Hall measurements, to characterize the GeSi heteroepitaxy quality. Optimal growth conditions have been identified to achieve low defect density, low RMS roughness with ...
Luo, Ying   +15 more
openaire   +2 more sources

Two Dimensional Analytical Modeling for SOI and SON MOSFET and Their Performance Comparison [PDF]

open access: yesЖурнал нано- та електронної фізики, 2011
During last few decade continuous device performance improvements have been achieved through a combination of device scaling, new device structures and material property improvement to its fundamental limits.
Saptarsi Ghosh   +3 more
doaj  

Optimization of Hybrid Silicon Microring Lasers

open access: yesIEEE Photonics Journal, 2011
In this paper, we review the recent optimization work in hybrid silicon microring lasers. Device structure and fabrication procedures are discussed first, followed by two major improvements in carrier injection and thermal management.
D. Liang   +6 more
doaj   +1 more source

Analysis of Voltage Transfer Characteristics of Nano-scale SOI CMOS Inverter with Variable Channel Length and Doping Concentration [PDF]

open access: yesЖурнал нано- та електронної фізики, 2015
During many decades, continuous device performance improvement has been made possible only through device scaling. But presently, due to aggressive scaling at the sub-micron or nanometer region, the conventional planner silicon technology is suffering ...
A. Daniyel Raj   +2 more
doaj  

Scheme Topological Modeling of Converters Signal Levels for Analytical Microsystems-on-Chip

open access: yesФізика і хімія твердого тіла, 2016
The results of scheme-topology design and computer modeling for signal level converter of integrated circuits and micro analysis on the basic matrix chip (BMK) with the structures "silicon-on-insulator" (SOI) are present in ...
V. V. Dovgiy, I T. Kohut, V. I. Holota
doaj   +1 more source

CMOS-Compatible Integrated Spectrometer Based on Echelle Diffraction Grating and MSM Photodetector Array

open access: yesIEEE Photonics Journal, 2013
We demonstrate an integrated spectrometer-on-a-chip composed of an echelle diffraction grating (EDG) and metal-semiconductor-metal (MSM) waveguide photodetector array based on silicon-on-insulator (SOI).
Xiao Ma, Mingyu Li, Jian-Jun He
doaj   +1 more source

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