Results 111 to 120 of about 2,116 (217)

Enhancing the Carrier Mobility and Bias Stability in Metal–Oxide Thin Film Transistors with Bilayer InSnO/a-InGaZnO Heterojunction Structure

open access: yesMicromachines
In this study, the electrical performance and bias stability of InSnO/a-InGaZnO (ITO/a-IGZO) heterojunction thin-film transistors (TFTs) are investigated.
Xiaoming Huang   +5 more
doaj   +1 more source

Mitigating Pass Gate Effect in Buried Channel Array Transistors Through Buried Oxide Integration: Addressing Interference Phenomenon Between Word Lines

open access: yesApplied Sciences
As semiconductor devices become smaller, their performance and integration density improve, but new negative effects emerge due to the reduced distance between structures. In DRAM, these effects can lead to data loss or require additional refresh cycles,
Yeongmyeong Cho   +2 more
doaj   +1 more source

Modeling of GaAs pHEMT parameters in Silvaco TCAD

open access: yesProceedings of Tomsk State University of Control Systems and Radioelectronics, 2016
openaire   +1 more source

Device Simulation of Si-Ge HBT Using SILVACO TCAD

open access: yesInternational Journal of Computer Sciences and Engineering, 2018
openaire   +1 more source

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