Results 251 to 260 of about 224,119 (296)

New SIMS method to characterize hydrogen in polysilicon films

Journal of Vacuum Science & Technology B, 2022
A new analysis protocol for profiling the hydrogen (H) concentration depth distributions in polysilicon (poly-Si) thin films on Si oxide was developed by using secondary ion mass spectrometry (SIMS). Traditional SIMS determination of H concentrations in poly-Si films is to monitor and collect the atomic H−, but this analysis method presents some ...
Xue-feng Lin, Agi Fucsko, Kari Noehring, Elaine Gabriel, Adam Regner, Scott York, David Palsulich   +6 more
openaire   +1 more source

A possible application of the SIMS method to determine the provenance of archaeological objects

Nuclear Instruments and Methods, 1980
Abstract The possibility was studied of using SIMS analysis to discriminate between varieties of flint of different provenance. The method, if successful when applied to flint implements found in prehistoric human settlements, might give valuable information to archaeologists.
M. DOMAŃSKI, B. WOJTOWICZ-NATANSON
openaire   +1 more source

Development of a GC–MS/SIM method for the determination of phytosteryl esters

Food Chemistry, 2019
A gas chromatography-mass spectrometry (GC-MS) method with selected ion monitoring (SIM) was developed and validated for identification and quantitative analysis of three phytosteryl esters, i.e., campesteryl oletate, stigmasteryl oletate and β-sitosteryl oletate.
Siyuan, Tan, Yongjie, Niu, Liang, Liu, Anping, Su, Chingyuan, Hu, Yonghong, Meng   +5 more
openaire   +2 more sources

Taxonomy of iPhone Activation and SIM Unlocking Methods

2007
This paper will discuss the different methods of SIM unlocking and activation for the Apple iPhone. Early iPhone activation and SIM card fabrication methods as well as the latest software only methods will be discussed. The paper will examine the benefits and drawbacks of each method. It will provide a step-by-step guide to creating a specially crafted
Al-Zarouni, Marwan, Al-Hajri, Haitham
openaire   +1 more source

Numerical prediction of interfacial instabilities: Sharp interface method (SIM)

Journal of Computational Physics, 2008
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Robert R. Nourgaliev, Meng-Sing Liou, Theo G. Theofanous   +2 more
openaire   +2 more sources

SIMS method and examples of applications in coral biomineralization

2014
International ...
Rollion-Bard, Claire, Blamart, Dominique
openaire   +2 more sources

A rapid method for detecting barbiturates in serum using EI-SIM

International Journal of Legal Medicine, 1994
A simple and rapid method for analysis of barbiturates in serum has been developed. In order to extract and clean barbiturates in serum, a separation column packed with Extrelut and Florisil was used, and the eluate was directly analyzed by means of electron impact selected ion monitoring (EI-SIM).
T, Kojima, T, Taniguchi, M, Yashiki, T, Miyazaki, Y, Iwasaki, T, Mikami, M, Ohtani   +6 more
openaire   +2 more sources

Method for Macromolecular Colocalization Using Atomic Recombination in Dynamic SIMS

The Journal of Physical Chemistry B, 2008
Localizing two or more components of assemblies in biological systems requires both continued development of fluorescence techniques and invention of entirely new techniques. Candidates for the latter include dynamic secondary ion mass spectrometry (D-SIMS).
Legent, G., Delaune, A., Norris, V., Delcorte, A., Gibouin, David, Lefebvre, Fabrice, Misevic, G., Thellier, M., Ripoll, C.   +8 more
openaire   +3 more sources

A THEORETICAL COMPARISON BETWEEN METHODS OF HENDRY AND SIMS

Ekonomik Yaklasim, 1999
This paper attempts to theoretically compare Hendry\'s general to specific modeliing and Vector Autoregressive (VAR) approach by Sims. It may be argued that Hendry\'s model is more appropriate for structural analysis. On the other hand, VAR modeliing can provide more information for the researchers whose main purpose is to make predictions and ...
openaire   +1 more source

Evaluating and Improving SIMS Method for Measuring Nitrogen in SiC

Materials Science Forum, 2006
A multiple data point version of the industry standard, two data point raster-changing procedure is employed to measure low levels (< 1 x 1017 atoms/cm3) of nitrogen (N) in silicon carbide (SiC) by SIMS (Secondary Ion Mass Spectrometry). A current-changing procedure is also employed.
Howard E. Smith, Kurt G. Eyink, W.C. Mitchel, M.C. Wood, Mark A. Fanton   +4 more
openaire   +1 more source