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Layered constellation generation method based on SIM-OFDM

Optics Communications, 2020
Abstract A layered QAM constellation generation method is proposed and it is applied to the SIM-OFDM system. In this method, the bit sequence is grouped layer by layer according to the specific bit and mapped to the corresponding constellation points. In this paper, the 24QAM-SIM-OFDM, 48QAM-SIM-OFDM, 80QAM-SIM-OFDM and 120QAM-SIM-OFDM constellations
Xin Wang   +9 more
openaire   +1 more source

ToF-SIMS as a New Method to Determine the Contact Angle of Mineral Surfaces

Langmuir, 2010
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used as a technique to correlate the surface chemistry of chalcopyrite particles with their contact angle. Three particle sizes (20-38, 75-105, and 150-210 microm) were used, covering a range of contact angles between 20 and 90 degrees.
Abreu, Susana Brito E.   +2 more
openaire   +5 more sources

Lubricant evaluation method for FDBs using TOF-SIMS

Microsystem Technologies, 2002
With the increase in recording density and data transfer rate of hard disk drive (HDD), fluid dynamic bearing (FDB) motors have been introduced due to their silence and high rotation accuracy. Although lubricant plays a major role in the development of FDB motors, it is extremely difficult to perform thorough evaluation because the quantity of ...
K. Matsuoka, S. Obata, F. Toujou
openaire   +1 more source

Method to control specimen charging for SIMS and AES of insulators

Journal of Vacuum Science and Technology, 1980
A method for controlling specimen charging in SIMS and AES of insulators, utilizing an extension of the metal diaphragm technique, is reported. (AIP)
Art Nelson, A. K. Green
openaire   +1 more source

Spatial statistics and interpolation methods for TOF SIMS imaging

Applied Surface Science, 2006
Multivariate statistical methods such as principal components analysis (PCA) and factor analysis (FA) have been applied to mass spectral data to extract higher quality information from ion intensities in the mass spectrum. This often leads to better image quality in the resulting image analysis of principal components or factors.
Tammy M. Milillo, Joseph A. Gardella
openaire   +1 more source

Investigating three methods for improving the performance of the SIM algorithm

Proceedings of IEEE Antennas and Propagation Society International Symposium and URSI National Radio Science Meeting, 2002
A sparse iterative method for solving electromagnetic problems has been implemented in an object-oriented version of NEC. The SIM is based on the generation of a sparse matrix which is factored and subsequently used in an iterative solution of a matrix equation. The paper investigates three methods of filling the sparse matrix.
D.C. Nitch, A.P.C. Fourie
openaire   +1 more source

A spectral integral method (SIM) for periodic and nonperiodic structures

IEEE Microwave and Wireless Components Letters, 2004
This letter presents a spectral integral method for electromagnetic scattering from dielectric objects with closed boundary. The method is developed for both periodic and nonperiodic structures. Numerical results demonstrate the spectral accuracy of the method, and the advantages over the method of moments.
null Jianguo Liu, null Qing Huo Liu
openaire   +1 more source

SIMS Combined with Other Methods of Surface Analysis

1984
Like all methods of surface analysis, SIMS provides only fragmentary information and therefore profits by combination with complementary techniques. Comparable results can only be obtained if these additional methods are applied to the same surface simultaneously or sequentially in one UHV system.
openaire   +1 more source

Gesture Recognition Method Based on Sim-ConvNeXt Model

2023
Yupeng Huo, Jie Shen, Li Wang, Yuxuan Wu
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Lunar Surface Observation usinge Remote SIMS Method

54th International Astronautical Congress of the International Astronautical Federation, the International Academy of Astronautics, and the International Institute of Space Law, 2003
This paper presents the results of a conceptual study for lunar surface observation using Remote SIMS (Secondary Ion Mass Spectrometry) installed on the lunar Lander and the results of the preliminary experiments of the secondary ion generation from the water ice that simulates the permanently shaded region of Lunar surface by fast ion bombardment ...
openaire   +1 more source

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