Results 241 to 250 of about 224,119 (296)
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SIMS method of material wear diagnosis
2009 IEEE International Conference on Industrial Technology, 2009The presented method is based on use of SIMS analysis. SIMS analysis allowed experimental demonstration of 100 … 300 times increase in the dissolved hydrogen concentration at a depth of 1 … 20 mm in the pipe wall after 20 years of operation. The hydrogen dissolved in the pipe wall from a gas flow in a gas-main pipeline.
Alfred Benninghoven, Evgenii A. Deulin
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The infinite velocity method: A new method for SIMS quantification
Surface and Interface Analysis, 1994Abstract Twelve elements spanning a mass range of 197 atomic mass units from five standard reference materials and three implant materials were analysed to ascertain the validity of a new method, termed the infinite velocity method, for quantifying the negative monatomic secondary ion emissions resulting from Cs‐bombarded surfaces ...
P. A. W. Van Der Heide +3 more
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A fast sparse iterative method (SIM) for method of moments
Proceedings of IEEE Antennas and Propagation Society International Symposium and URSI National Radio Science Meeting, 2002The sparse iterative method (SIM) provides a faster solution to method of moments (MoM) matrix equations than does LU-decomposition with forward and back substitution. The SIM produces a solution with computational time proportional to N/sup 2/, as opposed to the N/sup 3/ time dependence associated with LU-decomposition.
A.P.C. Fourie, D.C. Nitch
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SIMS and RBS analysis of leached glass: Reliability of RSF method for SIMS quantification
Journal of Materials Science: Materials in Electronics, 1996The reliability of the relative sensitivity factor (RSF) approach for secondary ion mass spectrometry (SIMS) quantification of the leached layers on glass was investigated by measuring comparable samples of glass with SIMS and RBS (Rutherford backscattering spectrometry). The RSF factors were calculated using the nominal bulk compositions.
A.A. Salem +5 more
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Methods for Generating Protein Molecular Ions in ToF-SIMS
Langmuir, 2004One of the greatest challenges in mass spectrometry lies in the generation and detection of molecular ions that can be used to directly identify the protein from the molecular weight of the molecular ion. Typically, proteins are large (MW > 1000), nonvolatile, and/or thermally labile, but the vaporization process produced by many mass spectrometry ...
McArthur, Sally L. +3 more
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A Spectral Integral Method (SIM) for Layered Media
IEEE Transactions on Antennas and Propagation, 2006A spectral integral method is presented for electromagnetic scattering from dielectric and perfectly electric conducting (PEC) objects with a closed boundary embedded in a layered medium. Two-dimensional layered medium Green's functions are computed adaptively by using Gaussian quadratures. The singular terms in the Green's functions and the non-smooth
E. Simsek, J. Liu, Q.H. Liu
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Investigation of hydrogen sensitivity of SIMS method
Surface and Interface Analysis, 1992Abstract Generally, papers in which hydrogen detection by the SIMS method is described do not touch upon the sensitivity and background level of hydrogen during the SIMS analysis. Problems connected with the detection and sensitivity of hydrogen in our SIMS equipment are discussed in this paper.
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SIMS methods in reactivity studies on metal oxides
Inorganica Chimica Acta, 1995Abstract A SIMS (secondary ion mass spectrometry) study of IrO2/RuO2/TiO2 mixed oxide films and PbO2 films synthesized by thermal and electrochemical processes, respectively, reveals interesting cluster ions that may be very important in evaluating component reactivity between different metal oxides and with trapped ions or neutral particles present ...
DAOLIO S. +4 more
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Comparison of depth profiles in SIMS by a fuzzy method
Mikrochimica Acta, 1992Automated quantitative comparison of depth-profiles recorded by SIMS based on a fuzzy difference measure has been used to characterize Sb and B implantation profiles in a marker experiment to study the diffusion of As in silicon. The variations of the concentration (intensity) measurements are described by a fuzzy set that is specified by smoothing the
Matthias Otto +4 more
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A NEW APPROACH OF THE SIMS METHOD FOR METAL CLUSTERS
Surface Review and Letters, 1996The size distributions of ( CsI )n Cs +, [Formula: see text], and [Formula: see text] (M: alkali metal, j=1, 2, 3, 4, 5) clusters were obtained using secondary-ion mass spectrometry. The sizes of stable neutral clusters ( CsI )n and ( Hg )n clusters were determined from the mass spectra of cluster ions ( CsI )n Cs + and ( Hg )nM+. The magic numbers of
I. KATAKUSE +4 more
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