Results 231 to 240 of about 779,893 (262)

Simulation and mitigation of single event effects

11th IEEE International On-Line Testing Symposium, 2005
This special session includes a presentation on nuclear codes used to determine a data-base of secondary ion species and their energies produced by the neutron-silicon and neutron-oxygen interactions, a presentation on FIT estimation tools using the secondary ions data-base created by the former codes and a presentation on design techniques suitable ...
L. Anghel, M. Nicolaidis
openaire   +1 more source

Single Event Effects: Mechanisms and Classification

2010
Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become an increasing limitation of the reliability of electronic components, circuits, and systems, and have stimulated abundant past and undergoing work for improving our understanding and developing mitigation techniques.
openaire   +1 more source

Physics-based simulation of single-event effects

IEEE Transactions on Device and Materials Reliability, 2005
This paper reviews techniques for physics-based device-level simulation of single-event effects (SEEs) in Si microelectronic devices and integrated circuits. Issues for device modeling of SEE are discussed in the context of providing physical insight into mechanisms contributing to SEE as well as providing predictive capabilities for calculation of SEE
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System mitigation techniques for single event effects

2008 IEEE/AIAA 27th Digital Avionics Systems Conference, 2008
Single event effects (SEE) caused by atmospheric radiation have been recognized in recent years as a design issue for avionics systems, as well as high reliability ground-based systems. This paper provides a background of the atmospheric radiation phenomenon and the resulting single event effects, including single event upset (SEU) and latch up ...
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Single event effects rate predictions in space

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
Abstract Computational methods for estimating single event error rates in space are reviewed. Single event effects are a source of error in spacecraft microelectronics caused by the passage of high-energy charged particles such as cosmic rays. These one- or few-bit errors may cause data loss or system malfunctions without any permanent damage to the ...
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Design for mitigation of single event effects

11th IEEE International On-Line Testing Symposium, 2005
Various fault tolerant techniques can be employed to mitigate SEUs, SETs and SELs. However, such techniques usually inquire high hardware, speed and power penalty that most commercial applications could not afford. This presentation concerns low cost mitigation techniques for single-event effects induced by alpha particles and atmospheric neutrons in ...
openaire   +1 more source

Radiation therapy‐associated toxicity: Etiology, management, and prevention

Ca-A Cancer Journal for Clinicians, 2021
Kyle Wang
exaly  

Synergistic Effects for Enhanced Catalysis in a Dual Single-Atom Catalyst

ACS Catalysis, 2021
Junhong Fu, Rui Si, Keju Sun
exaly  

Single Event Effects in Avionics

2017
openaire   +1 more source

Efficient generation of entangled multiphoton graph states from a single atom

Nature, 2022
Philip Thomas, Leonardo Ruscio, Olivier Morin   +2 more
exaly