Results 211 to 214 of about 807,584 (214)

Single-event upset and snapback in silicon-on-insulator devices and integrated circuits

IEEE Transactions on Nuclear Science, 2000
P E Dodd, D S Walsh, J R Schwank
exaly  

An Updated Perspective of Single Event Gate Rupture and Single Event Burnout in Power MOSFETs

IEEE Transactions on Nuclear Science, 2013
Jeffrey L Titus
exaly  

Predictors of outcome after single-event multilevel surgery in children with cerebral palsy

Bone and Joint Journal, 2016
exaly  

LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices

IEEE Transactions on Nuclear Science
Arijit Sengupta, Andrew L Sternberg, S Islam   +2 more
exaly