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The impact of low-carbon city pilot policies on urban energy intensity. [PDF]
Qian Y, Hu J, Guo B, Liu T, Hu H.
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Flexible and Interpretable Modeling of Overlapping Exposure Risks in Self-Controlled Case Series Analysis. [PDF]
Zhang X, Milligan P, Cheung YB.
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Destructive single-event effects in semiconductor devices and ICs
IEEE Transactions on Nuclear Science, 2003F W Sexton
exaly
Basic mechanisms and modeling of single-event upset in digital microelectronics
IEEE Transactions on Nuclear Science, 2003P E Dodd, L W Massengill
exaly

