Results 311 to 317 of about 11,947,015 (317)
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On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

IEEE Transactions on Nuclear Science, 2012
Lloyd Massengill   +2 more
exaly  

Single Event Multiple Transient (SEMT) Measurements in 65 nm Bulk Technology

2016
Evans Adrian   +2 more
exaly  

Digital Single Event Transient Trends With Technology Node Scaling

IEEE Transactions on Nuclear Science, 2006
exaly  

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