Results 301 to 310 of about 11,947,015 (317)

On-Chip Characterization of Single-Event Transient Pulsewidths

IEEE Transactions on Device and Materials Reliability, 2006
Ronald D. Schrimpf, Lloyd Massengill, William H. Robinson   +2 more
exaly  

A Comprehensive Analog Single-Event Transient Analysis Methodology

IEEE Transactions on Nuclear Science, 2004
M W Savage, J L Titus, C Poivey
exaly  

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

IEEE Transactions on Nuclear Science, 2009
Lloyd Massengill, Bharat Bhuva, Matthew J Gadlage   +2 more
exaly  

Heavy Ion and Proton Induced Single Event Transients in Comparators

IEEE Transactions on Nuclear Science, 1996
T F Miyahira, J R Coss, D K Nichols
exaly  

Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-Nm Bulk CMOS

IEEE Transactions on Nuclear Science, 2011
Lloyd Massengill, Arthur Frank Witulski, Bharat Bhuva   +2 more
exaly  

Estimation of Single Event Transient Voltage Pulses in VLSI Circuits From Heavy-Ion-Induced Transient Currents Measured in a Single MOSFET

IEEE Transactions on Nuclear Science, 2007
Kazuyuki Hirose
exaly  

High-Speed Pipelined ADC Architecture for Digital Signal Self-Calibration Based on the Single-Event Transient (SET) Phenomenon

2025 11th International Conference on Computer and Communications (ICCC)
Minrui Du, Bowen Deng, Gong Chen
openaire   +1 more source

Production and Propagation of Single-Event Transients in High-Speed Digital Logic ICs

IEEE Transactions on Nuclear Science, 2004
J R Schwank, P E Dodd, M R Shaneyfelt
exaly  

Improvement of Breakdown Characteristic for a Novel GaN HEMT with Enhanced Resistance Single-Event Transient Effect

Journal of Electronic Materials
Shu-Xiang Sun, Yajun Zhang, Yi-Han Si, Juan Xiong, Xiaorong Luo   +4 more
semanticscholar   +1 more source

Heavy Ion-Induced Digital Single-Event Transients in Deep Submicron Processes

IEEE Transactions on Nuclear Science, 2004
P E Dodd
exaly