Results 281 to 290 of about 11,947,015 (317)

Development of Radiation Hardened By Design (RHBD) of NAND gate to mitigate the effects of single event transients (SET)

2016 IEEE 1st International Conference on Power Electronics, Intelligent Control and Energy Systems (ICPEICES), 2016
Integrated circuits (ICs) operated in harsh environment that consist of various energetic particles is a threat for electronic equipments can provoke temporary errors or soft errors and various undesired effects. This paper presents a Radiation Hardened By Design (RHBD) of NAND gate using dynamic logic at 0.18µm technology is developed with the help of
Praveen Rathore, Sangeeta Nakhate
openaire   +1 more source

Triple-Node-Upset Recovery High-Impedance-State-Insensitive and Single-Event-Transient Filtering Latch for Aerospace Applications

IEEE Transactions on Aerospace and Electronic Systems
This article proposes a 4 × 4-device-Matrix-based Cost-optimized Triple-node-upset (TNU)-recovery High-impedance-state (HIS)-insensitive and Single-event-transient (SET) filtering Latch, namely MCTHSL, designed for aerospace applications.
Ai-Bin Yan, Zhuoyuan Lin, Yongkang Xu, Na Bai, Jie Cui, Zheng-Feng Huang, Tian-Ming Ni, Patrick Girard, Xiao-Qing Wen   +8 more
semanticscholar   +1 more source

Comparison of Single-Event Transient Under Heavy Ion and Pulsed Laser Irradiation in SiGe HBT Ultrawideband LNA

IEEE Transactions on Electron Devices
This article presents a comprehensive study of single-event effects (SEEs) in a three-stage Silicon Germanium heterojunction bipolar transistors (SiGe HBTs)-based ultrawideband low-noise amplifier (UWB LNA) under heavy ion and pulsed laser irradiation ...
Xiaoyu Pan, Jin-Xin Zhang, Xin Wang, Fei Guo, Dong-Ning Hao, Hong-Xia Guo, Ya-Hui Feng, Yi-Jun Cui, Weiqiang Liu   +8 more
semanticscholar   +1 more source

Soft Error Tolerant Bandgap Reference Utilizing Single-Event Transient Filtering Technique

IEEE Transactions on Nuclear Science
Bandgap is a critical block for numerous electronic systems, which provides stable voltage reference for multiple submodules over process, voltage supply, and temperature (PVT) fluctuations.
Jingtian Liu, Dong-Sheng Wang, Bin Liang, Ya-Qing Chi, Deng Luo, Shi Xu   +5 more
semanticscholar   +1 more source

Simulation and analysis of inverse-mode operation of single event transient mechanisms on NPN-SiGe HBT

Physica Scripta
This work presents the characteristics of the single event transient (SET) induced by a single heavy ion in the inverse mode NPN-SiGe HBT simulated with the Silvaco TCAD toolkit.
Mathew Adefusika Adekoya, Shuhuan Liu, Xuan Wang, T. Xing, Haodi Li, Fanjun Meng, Xiaozhi Du, Zhuoqi Li, Ta-Chien Huang   +8 more
semanticscholar   +1 more source

Dual-Modular-Redundancy Voting Circuits for Single-Event-Transient Mitigation

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Single Event Transient faults pose an increasing challenge in reliability design especially regarding internal nodes of combinational voting circuits, as device dimensions shrink and working frequencies boost in modern technologies.
Marcello Barbirotta, Marco Angioli, A. Mastrandrea, F. Menichelli, Abdallah Cheikh, Mauro Olivieri   +5 more
semanticscholar   +1 more source

An Analysis of folded cascode comarator by Single Event Transient(SET)

, 2020
J. Jang, Jae-Pil Chung, Jung-Cheul park
semanticscholar   +1 more source

Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects

Microelectronics Reliability, 2023
Paula R.P. Allegro, Dennis L. Toufen, Vitor A.P. Aguiar, Lucas S.A. dos Santos, William N. de Oliveira, Nemitala Added, Nilberto H. Medina, Eduardo L.A. Macchione, Saulo G. Alberton, Marcilei A. Guazzelli, Marco A.A. Melo, Juliano A. Oliveira   +11 more
openaire   +1 more source

Comparative Analysis of Single Event Transients in InGaAs-OI/Bulk/BOI FinFETs for SET-Tolerant InGaAs/Ge-OI Complementary FinFET Circuits

IETE Journal of Research, 2023
Y. M. Aneesh, B. Bindu
openaire   +1 more source

Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser

, 2002
S. Buchner, D. McMorrow, A. Sternberg, L. Massengill, R. Pease, M. Maher   +5 more
semanticscholar   +1 more source