Results 261 to 270 of about 11,947,015 (317)

Single-Event Transient (SET) sensitivity into the Clock Networks of FPGAs

2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2021
In this paper we propose to investigate the impact of Single-Event Transient (SET) on the clock tree resources of field-programmable gate arrays (FPGA) towards radiations.
N. Guibbaud, F. Miller, T. Colladant
openaire   +2 more sources

Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation Techniques

IEEE Transactions on Nuclear Science, 2018
Single-event transients (SETs) in 16-/14-nm bulk fin field effect transistor (finFET) logic chains have been measured using a custom-designed test IC. A variety of logic gate chains were designed, and SET pulse widths were obtained across a wide range of supply voltages. In light of the increased SET response at reduced supply voltages, the efficacy of
J. A. Maharrey, J. S. Kauppila, R. C. Harrington, P. Nsengiyumva, D. R. Ball, T. D. Haeffner, E. X. Zhang, B. L. Bhuva, W. T. Holman, L. W. Massengill   +9 more
openaire   +2 more sources

An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET

Journal of Electronic Testing
Baojun Liu 0001, Li Cai, Chuang Li
openaire   +2 more sources

Single event transient (SET) for a novel step-truncated SELBOX FinFET device

Analog Integrated Circuits and Signal Processing
Baojun Liu, Jing Zhu
openaire   +2 more sources

Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor

Science China Information Sciences, 2017
Jinxin Zhang, Hongxia Guo, Fengqi Zhang, Chaohui He, Pei Li, Yunyi Yan, Hui Wang, Linxia Zhang   +7 more
openaire   +2 more sources

Reliability Evaluation of the Count Min Sketch (CMS) against Single Event Transients (SETs)

2021 IEEE 39th VLSI Test Symposium (VTS), 2021
Estimating the frequency of the elements in a data set is commonly needed in data analysis. With the increase of the size of the data sets, accurately computing the number of times that each element appears with a counter becomes impractical. Instead, the Count Min Sketch (CMS) is widely used in big data processing to estimate frequency due to its ...
Jinhua Zhu, Zhen Gao 0005, Jie Jin, Pedro Reviriego   +3 more
openaire   +2 more sources

Development of a test methodology for single-event transients (SETs) in linear devices

IEEE Transactions on Nuclear Science, 2001
We present single-event transient (SET) test data on linear devices under many operational conditions in an attempt to understand the SET generation and characteristics. This is done in an attempt to define a low-cost conservative test methodology to characterize these effects.
C. Poivey, J.W. Howard, S. Buchner, K.A. LaBel, J.D. Forney, H.S. Kim, A. Assad   +6 more
openaire   +1 more source

Single Event Transients (SETs) in the RH108 Operational Amplifier in Analog Circuits

2006 IEEE Radiation Effects Data Workshop, 2006
The effect of various commercial power devices are presented. The devices have proved to be very fragile to single event effects, with some of the devices actually succumbing to catastrophic SEE with protons.
Rosa Chavez, Leif Scheick, Tetsuo Miyahira, Allan Johnston   +3 more
openaire   +1 more source

Critical charge for single-event transients (SETs) in bipolar linear circuits

IEEE Transactions on Nuclear Science, 2001
The critical charge for single-event transients (SETS) from heavy ions has been simulated and measured in bipolar linear circuits under several bias conditions. Although in many cases the threshold linear energy transfer is less than 2 MeV-cm/sup 2//mg, the minimum critical charge is of the order of 0.3-1 pC.
R.L. Pease, A. Sternberg, L. Massengill, R. Schrimpf, S. Buchner, M. Savage, J. Titus, T. Turflinger   +7 more
openaire   +1 more source

Analysis of Single-Event Transients (SETs) Using Machine Learning (ML) and Ionizing Radiation Effects Spectroscopy (IRES)

IEEE Transactions on Nuclear Science, 2021
A methodology for automating the identification of single-event transients (SETs) through ionizing radiation effects spectroscopy (IRES) and machine learning (ML) is provided. IRES enhances the identification of SETs through statistical analysis of waveform behavior, allowing for the capture of subtle circuit dynamics changes.
T. D. Loveless, D. R. Reising, J. C. Cancelleri, L. W. Massengill, D. McMorrow   +4 more
openaire   +1 more source