Results 251 to 260 of about 11,947,015 (317)

Simultaneous Single-Event Transient (SET) Observation on LM139A Wired-and Comparator Circuit

IEEE Transactions on Nuclear Science, 2021
The sensitivity of the LM139A quad voltage comparator toward simultaneous single-event transient has been investigated through laser single photon absorption. The results have been supported and compared to heavy-ion tests. The analysis of sensitivity leads to the observation of two sensitive cases related to internal charge-sharing mechanism between ...
S. Morand, C. Binois, H. Claret de Fleurieu, A. Carvalho, A. Samaras, T. Clatworthy, K. Kruckmeyer, M. Marin, R. Mangeret, G. Salvaterra, D. Staerk   +10 more
openaire   +2 more sources

Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit

2018 IEEE International Reliability Physics Symposium (IRPS), 2018
This paper investigates alpha-induced single event transient (SET) in combinational-logic in 10 nm bulk FinFET technology. FinFET technology improves SET in combinational-logic as well as single event upset (SEU) in flip-flops.
Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Jungman Lim, Seungbae Lee, Hyun-Chul Sagong, Sangwoo Pae   +7 more
openaire   +2 more sources

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527), 2002
The single event transient (SET) sensitivity of a radiation hardened voltage comparator type with vertical input transistors is compared with that observed for a COTS device type made up of lateral transistors. The cause of the difference in sensitivity is investigated.
R. Koga, S.H. Crain, K.B. Crawford, S.C. Moss, S.D. LaLumondiere, J.W. Howard   +5 more
openaire   +2 more sources

Single-event transient (SET) characterization of a LM119 voltage comparator: an approach to SET model validation using a pulsed laser

RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605), 2002
The characteristics of single-event transients (SETs) generated in an LM119 voltage comparator with a pulsed laser have been studied under a wide variety of operating conditions. Those transients can be compared with transients obtained from circuit simulator programs to validate the model parameters used by those programs.
S. Buchner, D. McMorrow, A. Sternberg, L. Massengill, R.L. Pease, M. Maher   +5 more
openaire   +2 more sources

Implications of Total Dose on Single-Event Transient (SET) Pulse Width Measurement Techniques

IEEE Transactions on Nuclear Science, 2008
Most pulse width characterization circuits measure single-event transients (SETs) using a target circuit consisting of long inverter chains or temporal latches exposed to heavy-ions over extended periods of time. For these approaches, circuit-level effects eliminate shorter pulses due to prolonged heavy-ion exposure providing the worst case estimate of
A. Balasubramanian, B. Narasimham, B. L. Bhuva, L. W. Massengill, P. H. Eaton, M. Sibley, D. Mavis   +6 more
openaire   +2 more sources

Single event transient (SET) sensitivity of Advanced BiCMOS Technology (ABT) buffers and transceivers

IEEE Radiation Effects Data Workshop, 2003
Heavy ion induced single event transients for various Advanced BiCMOS Technology (ABT) buffers and transceivers are presented. For our test samples there is a wide variation in the transient sensitivity. Some test samples are sensitive to single event latch-up.
R. Koga, P. Yu, S. Crain, K. Crawford, K. Chao   +4 more
openaire   +2 more sources

Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

2009 IEEE Radiation Effects Data Workshop, 2009
Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor's LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog products reported by others plus raise new considerations when ...
Kirby Kruckmeyer, Stephen P. Buchner, Sandeepan DasGupta   +2 more
openaire   +2 more sources

Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators

IEEE Transactions on Nuclear Science, 2002
We have measured the single-event transient (SET) response for a number of 139-type comparators with differing topologies. In this paper, we present the results from pulsed laser measurements on a number of different 139-type devices, as well as heavy ion measurements on a new RM139 device from NSC.
S.D. LaLumondiere, R. Koga, P. Yu, M.C. Maher, S.C. Moss   +4 more
openaire   +2 more sources

Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators

2017 IEEE Radiation Effects Data Workshop (REDW), 2017
This data compendium reports single event transient (SET) and total ionizing dose (TID) test results for commonly used commercial-off-the-shelf (COTS) and radiation hardened voltage comparators targeted for possible use in space-based missions. Interesting trends in the variability of the radiation performance of these devices due to differences in lot
Amanda N. Bozovich, Farokh Irom
openaire   +2 more sources

Single Event Transient (SET) Susceptibility of the Texas Instruments LM139 Quad Comparator under Proton Irradiation

2013 IEEE Radiation Effects Data Workshop (REDW), 2013
Proton Single Event Transient (SET) data are presented for the Texas Instruments (National Semiconductor) LM139AxQMLV (5962R9673801VxA).
Razvan Gaza, Jaime Cooper
openaire   +2 more sources