Results 31 to 40 of about 11,947,015 (317)

SET Pulse Characterization and SER Estimation in Combinational Logic with Placement and Multiple Transient Faults Considerations

Technologies, 2020
Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the problem.
Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestor Evmorfopoulos, George Dimitriou, Georgios I. Stamoulis   +4 more
doaj   +1 more source

Highly Reliable Quadruple-Node Upset-Tolerant D-Latch

IEEE Access, 2022
As CMOS technology scaling pushes towards the reduction of the length of transistors, electronic circuits face numerous reliability issues, and in particular nodes of D-latches at nano-scale confront multiple-node upset errors due to their operation in ...
Seyedehsomayeh Hatefinasab, Akiko Ohata, Alfonso Salinas, Encarnacion Castillo, Noel Rodriguez   +4 more
doaj   +1 more source

Synergistic effect of total ionizing dose and single-event upset in the analog/digital converter AD574

Fushe yanjiu yu fushe gongyi xuebao, 2021
This study investigates the AD574, a 12-bit analog/digital converter (ADC) produced by American Analog Devices, Inc. (ADI) using bipolar/I2L technology. The test samples are subjected to a total ionizing dose (TID) of 400 Gy(Si) under 60Co γ irradiation.
XIANG Chuanfeng, YAO Shuai, YU Xin, LI Xiaolong, LU Wu, WANG Xin, LIU Mohan, SUN Jing, GUO Qi, CAI Jiao, YANG Sheng   +10 more
doaj   +1 more source

Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment [PDF]

, 2022
Space radiation and nuclear reactors produce single event effects (SEE) in electronic circuits and impact their performance. The SEE phenomena cause circuits and electronic devices to fail by producing faulty results.
Wael, Mohamed
core  

Investigation of Incident Angle Dependence of Single Event Transient Model in MOSFET

, 2023
As the manufacturing process level of semiconductor devices continues to improve, the device size gradually decreases, and the devices are affected by the single event effect more and more severely.
Yibo Wang, Fan Zhang, Minghu Wu, Zilong Zhou, Yi Liu   +4 more
core   +1 more source

Characterization of the Total Charge and Time Duration for Single-Event Transient Voltage Pulses in a 65-nm CMOS Technology

IEEE Transactions on Nuclear Science, 2022
This article presents the circuits and heavy-ion irradiation test results of a single-event transient (SET) measurement chip in a 65-nm complementary metal–oxide–semiconductor (CMOS) technology.
Zheyi Li, Laurent Berti, J. Wouters, Jia-Lei Wang, P. Leroux   +4 more
semanticscholar   +1 more source

Pulse-Length Determination Techniques in the Rectangular Single Event Transient Fault Model [PDF]

, 2013
ISBN : 978-1-4799-0102-9International audienceOne of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model.
Kerkhoff, Hans G., Enrico Costenaro, Dan Alexandrescu, Kerkhoff, H., Rohani, A., Alexandrescu, D., Alireza Rohani, Alexandrescu, Dan, Costenaro, E., Hans G. Kerkhoff, costenaro, enrico   +10 more
core   +1 more source

A Static Analysis for the Minimization of Voters in Fault-Tolerant Circuits [PDF]

Leibniz Transactions on Embedded Systems, 2018
We present a formal approach to minimize the number of voters in triple-modular redundant (TMR) sequential circuits. Our technique actually works on a single copy of the TMR circuit and considers a large class of fault mo dels of the form “at most 1 ...
Burlyaev, Dmitry, Fradet, Pascal, Girault, Alain   +2 more
doaj   +1 more source

“We Cannot Talk as a Family”: Complexities of Survivorship Communication Among Hispanic/Latino Young Adult Survivors of Childhood Cancer, Parents, and Clinicians

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Young adult childhood cancer survivors (YA‐CCS) have an increased risk of treatment‐related health complications throughout their lives. Lifelong survivorship care is recommended, yet many YA‐CCS experience disruptions in care during pediatric‐to‐adult transitions and do not receive recommended survivorship care.
Kevin Shanchen Pu, Nicole Fernández‐Viña, Briana C. Martin‐Villa, Daniela Ramirez, Rebecca M. Lewinsohn, Mary Smith, Heidi Boynton, Lidia Schapira, Stephanie M. Smith   +8 more
wiley   +1 more source

Modeling single-event transients in complex digital systems [PDF]

, 2002
A methodology to determine the effect of single-event transients (SETs) on complex digital systems has been developed. This methodology is based on the SET-state-transition model. This model breaks the complex digital system down into five states.
Clark, Kenneth A.
core   +1 more source