Results 191 to 200 of about 10,455 (213)
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Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, 2018
Dakai Chen   +2 more
exaly  

Estimation of Single Event Upset (SEU) rates inside the SAA during the geomagnetic storm event of 15 May 2005

2021 IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE), 2021
Kirolosse M. Girgis   +2 more
openaire   +1 more source

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

IEEE Transactions on Nuclear Science, 2008
Kenneth A Label
exaly  

Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017
Aibin Yan, Maoxiang Yi, Huaguo Liang
exaly  

Suggested Single Event Upset Figure of Merit

IEEE Transactions on Nuclear Science, 1983
exaly  

Physical Mechanisms of Proton-Induced Single-Event Upset in Integrated Memory Devices

IEEE Transactions on Nuclear Science, 2019
Pablo Caron, Laurent Art
exaly  

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