Results 191 to 200 of about 10,455 (213)
Some of the next articles are maybe not open access.
Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory
IEEE Transactions on Nuclear Science, 2018Dakai Chen +2 more
exaly
2021 IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE), 2021
Kirolosse M. Girgis +2 more
openaire +1 more source
Kirolosse M. Girgis +2 more
openaire +1 more source
Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM
IEEE Transactions on Nuclear Science, 2008Kenneth A Label
exaly
Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017Aibin Yan, Maoxiang Yi, Huaguo Liang
exaly
Basic mechanisms and modeling of single-event upset in digital microelectronics
IEEE Transactions on Nuclear Science, 2003exaly
Physical Mechanisms of Proton-Induced Single-Event Upset in Integrated Memory Devices
IEEE Transactions on Nuclear Science, 2019Pablo Caron, Laurent Art
exaly

