Results 201 to 210 of about 989 (213)

Fault tolerant techniques to diagnose and mitigate Single Event Upset (SEU) effects on electronic programmable devices

2008
This research faces the problem of disturbance induced by high energy particles on electronic devices. Based on detailed analysis of this phenomenon, the work is divided into two parts: in the first part testing of the Single Event Upset (SEU) has been carried out with the aim of determining diagnostic techniques and the mitigation of this disturbance,
CIANI, LORENZO, CATELANI, MARCANTONIO, L. Veltroni   +2 more
openaire   +1 more source

Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

IEEE Transactions on Nuclear Science, 2008
Kevin M Warren, Andrew L Sternberg, Robert A Weller   +2 more
exaly  

Single Event Upset (SEU) Mitigation Techniques

2007
openaire   +1 more source

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, 2018
Dakai Chen, Edward P Wilcox, R Ladbury
exaly  

Single-Event Upset (SEU) Results of Embedded Error Detect and Correct Enabled Block Random Access Memory (Block RAM) Within the Xilinx XQR5VFX130

IEEE Transactions on Nuclear Science, 2010
Gregory R Allen, Larry Edmonds
exaly  

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
B L Bhuva, L W Massengill, W T Holman
exaly  

Computational method to estimate Single Event Upset rates in an accelerator environment

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2000
F Faccio
exaly  

Single Event Upset cross sections at various data rates

IEEE Transactions on Nuclear Science, 1996
R A Reed, M A Carts, P W Marshall
exaly  

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

IEEE Transactions on Nuclear Science, 2008
David F Heidel, Paul W Marshall, Kenneth A Label   +2 more
exaly  

Selective Triple Modular Redundancy for Single Event Upset (SEU) Mitigation.

openaire   +1 more source