Results 201 to 210 of about 10,455 (213)

Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

IEEE Transactions on Nuclear Science, 2008
Andrew L Sternberg, Robert A Weller, Robert A Reed   +2 more
exaly  

Device simulation of charge collection and single-event upset

IEEE Transactions on Nuclear Science, 1996
exaly  

Single Event Upset Testing with Relativistic Heavy Ions

IEEE Transactions on Nuclear Science, 1984
exaly  

The Variability of Single Event Upset Rates in the Natural Environment

IEEE Transactions on Nuclear Science, 1983
exaly  

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

IEEE Transactions on Nuclear Science, 2007
exaly  

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
exaly  

Immuno-oncology upset in bladder cancer

Nature Reviews Drug Discovery, 2017
exaly  

Single Event Upset Measurements of Gaas E-JFET RAMS

IEEE Transactions on Nuclear Science, 1983
exaly  

Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

IEEE Transactions on Nuclear Science, 2008
exaly  

Single-event upset and snapback in silicon-on-insulator devices and integrated circuits

IEEE Transactions on Nuclear Science, 2000
exaly