Results 211 to 220 of about 213,131 (262)

Single event transient effects in a voltage reference

Microelectronics Reliability, 2005
Abstract The Single Event Transient response of the LM236 band gap voltage reference from Texas Instruments is analyzed through heavy ion experiments and simulation. The LM236 circuit calibration was performed using generic transistor parameters that were subsequently optimized using device and circuit simulations.
P. C. Adell, Ronald D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, Hugh J. Barnaby, O. Mion   +6 more
openaire   +1 more source

Current Transients in Single Nanoparticle Collision Events

Journal of the American Chemical Society, 2008
Electrochemical hydrazine oxidation and proton reduction occur at a significantly higher rate at Pt than at Au or C electrodes. Thus, the collision and adhesion of a Pt particle on a less active Au or C electrode leads to a large current amplification by electrocatalysis at single nanoparticles (NPs). At low particle concentrations, the collision of Pt
Xiaoyin, Xiao, Fu-Ren F, Fan, Jiping, Zhou, Allen J, Bard   +3 more
openaire   +2 more sources

A model for single-event transients in comparators

IEEE Transactions on Nuclear Science, 2000
A two-step modeling approach is developed for single-event transients in linear circuits that uses the PISCES device simulation program to calculate transient currents in key internal transistor structures. Those currents are then applied at the circuit level using the SPICE circuit analysis program.
A.H. Johnston, G.M. Swift, T.F. Miyahira, L.D. Edmonds   +3 more
openaire   +1 more source

A compendium of single event transient data

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588), 2002
We present a compendium on observed Single Event Transients on analog and digital circuits. Both the data and the test methods used are presented.
M.W. Savage, T. Turflinger, J.W. Howard, S. Buchner   +3 more
openaire   +1 more source

Single event transients in operational amplifiers

IEEE Radiation Effects Data Workshop, 2005., 2005
A number of bipolar operational amplifiers have been evaluated for single event effects for possible use in a space application. Various trigger thresholds were used to estimate the distribution of transient amplitudes.
J. George, R. Koga, S. Crain, P. Yu, S. Nguyen, E. Normandy, D. Kachuche, B.K. Steffan   +7 more
openaire   +1 more source

Single-Event Transients in Voltage Regulators

IEEE Transactions on Nuclear Science, 2006
Single-event transients are investigated for two voltage regulator circuits that are widely used in space. A circuit-level model is developed that can be used to determine how transients are affected by different circuit application conditions. Internal protection circuits-which are affected by load as well as internal thermal effects-can also be ...
Johnston, A. H., Miyahira, T. F., Irom, F., Laird, J. S.   +3 more
openaire   +2 more sources

Systematic analyses for latching probability of single-event transients

Fifteenth International Symposium on Quality Electronic Design, 2014
Soft errors caused by particle strikes are expected to increase as technology scales down. This is partially because more single-event transients (SET) are latched by memory elements at the primary output of combinational circuits. To speed up the assessment of SET-induced soft errors, we propose a systematic analysis method to examine the probability ...
Hoda Pahlevanzadeh, Qiaoyan Yu
openaire   +1 more source

Detection of Single Event Transients Based on Compressed Sensing

2017 IEEE Trustcom/BigDataSE/ICESS, 2017
Single event transients (SETs) have seriously deteriorated the reliability Integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and future enhancement.
Cuiping Shao, Huiyun Li
openaire   +1 more source

Single Event Transient Tolerant Bloom Filter Implementations

IEEE Transactions on Computers, 2017
Bloom filters have been used to reduce the delay in networking and computing applications when a set membership check is to be applied. Error sources can affect the behavior of Bloom filters resulting in a wrong outcome of this membership test and a possible effect in the system's output.
Alfonso Sánchez-Macián, Pedro Reviriego, Juan Antonio Maestro, Shanshan Liu 0001   +3 more
openaire   +1 more source

Reliability Evaluation for Single Event Transients on Digital Circuits

IEEE Transactions on Reliability, 2012
The effect of single event transient (SET) on reliability has become a significant concern for digital circuits. This paper proposed an algorithm for evaluating the reliability for SET on digital circuits, based on signal probability, universal generating function technique, and generalized reliability block diagrams.
Baojun Liu, Li Cai
openaire   +1 more source