Results 1 to 10 of about 211,486 (163)

Simulation of Single-Event Transient Effect for GaN High-Electron-Mobility Transistor [PDF]

Micromachines, 2023
A GaN high-electron-mobility transistor (HEMT) was simulated using the semiconductor simulation software Silvaco TCAD in this paper. By constructing a two-dimensional structure of GaN HEMT, combined with key models such as carrier mobility, the effects ...
Zhiheng Wang, Yanrong Cao, Xinxiang Zhang, Chuan Chen, Linshan Wu, Maodan Ma, Hanghang Lv, Ling Lv, Xuefeng Zheng, Wenchao Tian, Xiaohua Ma, Yue Hao   +11 more
doaj   +4 more sources

Heavy Ions Induced Single-Event Transient in SiGe-on-SOI HBT by TCAD Simulation [PDF]

Micromachines
In this work, the effects of heavy ion strike position, incident angle, linear energy transfer (LET) value, ambient temperature, bias conditions, and the synergistic effects of total dose irradiation on the single-event transient (SET) in silicon ...
Yuedecai Long, Abuduwayiti Aierken, Xuefei Liu, Mingqiang Liu, Changsong Gao, Gang Wang, Degui Wang, Sandip Majumdar, Yundong Xuan, Mengxin Liu, Jinshun Bi   +10 more
doaj   +2 more sources

Efficient Modeling of Single Event Transient Effect with Limited Peak Current: Implications for Logic Circuits [PDF]

Micromachines
The problem that the conventional double-exponential transient current model (DE model) can overdrive the circuit, which leads to the overestimation of the soft error rate of the logic cell, is solved.
Yujian Wang, Hongliang Lu, Caozhen Yang, Yutao Zhang, Ruxue Yao, Rui Dong, Yuming Zhang   +6 more
doaj   +2 more sources

On-Chip Characterization of Single-Event Transient Pulsewidths [PDF]

IEEE Transactions on Device and Materials Reliability, 2006
A new on-chip single-event transient (SET) test structure has been developed to autonomously characterize the widths of random SET pulses. Simulation results show measurement granularity of 900 ps for a 1.5 mum technology and also indicate that the measurement granularity rapidly scales down with technology. Laser tests were used to demonstrate circuit
Balaji Narasimham, B L Bhuva, Ronald D Schrimpf   +2 more
exaly   +2 more sources

Experimental Investigation of Charge Sharing Induced SET Depending on Transistors in Abutted Rows in 65 nm Bulk CMOS Technology

IEEE Access, 2022
The effect of transistors in abutted rows on charge sharing is investigated by changing the configuration of the transistors in abutted rows in this work.
Xiaowei He, Daheng Yue, Pengcheng Huang, Zhenyu Zhao   +3 more
doaj   +1 more source

Experimental Comparison of the Single-Event Effects of Single-Photon and Two-Photon Absorption under a Pulsed Laser

Applied Sciences, 2022
The pulsed laser has gradually become the standard method of studying the single-event effects of micro-nano devices, and it is a powerful supplement to heavy ion experiments on single-event effects.
Heng An, Detian Li, Xuan Wen, Shengsheng Yang, Chenguang Zhang, Jun Wang, Zhou Cao   +6 more
doaj   +1 more source

Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit

IET Circuits, Devices and Systems, 2022
Single‐event transients (SETs) due to heavy‐ion (HI) strikes adversely affect the electronic circuits in the sub‐100 nm regime in the radiation environment.
Arumugam Karthigeyan, Sankararajan Radha, Esakkimuthu Manikandan   +2 more
doaj   +1 more source

Influence of Punch Trough Stop Layer and Well Depths on the Robustness of Bulk FinFETs to Heavy Ions Impact

IEEE Access, 2022
This study analyzes the effects of the punch-through stop (PTS) layer and well depth in a bulk FinFET SRAM cell on the fraction of charge generated by an ion impact that is collected by the FinFET channel.
Antonio Calomarde, Salvador Manich, Antonio Rubio, Francisco Gamiz   +3 more
doaj   +1 more source

A single event transient detector in SRAM-based FPGAs

IEICE Electronics Express, 2017
Xiumin Xu, Huaguo Liang, Zhengfeng Huang   +2 more
exaly   +3 more sources

Single Event Transient tolerant Count Min Sketches

Microelectronics Reliability, 2022
Frequency estimation is a common operation in big data processing. In many big data applications, computing the exact data frequency is not practical as it requires a large computational effort. Instead, a reasonably accurate estimate is commonly used.
Zhu, Jinhua, Jin, Jie, Gao, Zhen, Reviriego Vasallo, Pedro   +3 more
openaire   +2 more sources