Results 41 to 50 of about 269,063 (304)

Single Event Transients in CMOS Ring Oscillators [PDF]

Electronics, 2019
In this paper, a time-variant analysis is made on Single-Event Transients (SETs) in integrated CMOS ring oscillators. The Impulse Sensitive Function (ISF) of the oscillator is used to analyze the impact of the relative moment when a particle hits the circuit. The analysis is based on simulations and verified experimentally with a Two-Photon Absorption (
Prinzie, Jeffrey, De Smedt, Valentijn
openaire   +1 more source

Single Event Transient Study of pMOS Transistors in 65 nm Technology With and Without a Deep n+ Well Under Particle Striking

IEEE Access, 2019
In triple-well PMOSFET transistor, a deep n+ well (DNW) is a process used to isolate the substrate noise, which can lead to changes in effect of single event transient (SET). In outer space, collision of cosmic energetic particles with sensitive nodes of
Jizuo Zhang, Liang Fang, Jianjun Chen, Shen Hou, Xianyu Tong   +4 more
doaj   +1 more source

Coordinated cluster and ground-based instrument observation of transient changes in the magnetopause boundary layer during an interval of predominantly northward IMF: Relation to reconnection pulses and FTE signatures [PDF]

, 2001
We study a series of transient entries into the low-latitude boundary layer (LLBL) of all four Cluster spacecraft during an outbound pass through the mid-afternoon magnetopause ([XGSM,YGSM,ZGSM] ≈ [2,7,9]RE).
Eglitis, P., M. A. Hapgood, J. Moen (7594049), Donovan, E. F., Moen, J., Lockwood, M., M. N. Wild (7632371), A. P. van Eyken, Pulkkinen, T. I., Dunlop, M., Bosqued, J. M., K. Kauristie (7591778), Mark Lester (6477935), Donovan, E., F. Pitout, A. P. van Eyken (7594868), Denig, W. F., Rème, H., Alcaydé, D., I. W. McCrea, Hansen, T., A. Stromme (7693499), A. Strømme, M. Lester, A. Balogh, H. Opgenoorth (7613612), S. K. Morley (7012226), T. Hansen (3919604), M. Lockwood (7612331), McCrea, I. W., Watermann, J., Hansen, T. L., M. Taylor (3926213), J. Watermann (7632386), Pulkkinen, T., R. Behlke, Lockwood, Mike, M. Dunlop, W. Denig, Lu, G., R. Behlke (7594133), M. Engebretson (7632383), T. Hansen, Hapgood, M. A., G. Lu, D. Alcayde (7693502), Engebretson, M., R. Stamper (7630469), P. Eglitis, Provan, G., Wild, J. A., Strømme, A., Pitout, F., E. Donovan, M. Lockwood, O. Amm (7591346), M. Taylor, Opgenoorth, H. J., A. Balogh (7591361), F. Pitout (7612724), Stamper, R., M. Dunlop (7596542), Opgenoorth, H., A. Fazakerley (7596551), J. Moen, Behlke, R., R. Stamper, Fazakerley, A. N., J. Watermann, P. L. Blelly (7651616), Cully, C., Dunlop, M. W., M. A. Hapgood (7632368), Morley, S. K., O. Amm, P. Prikryl, Lester, M., Denig, W., G. Lu (4657921), E. Donovan (7591466), D. Alcaydé, Wild, M. N., J. A. Wild, R. Greenwald (7632356), Engebretson, M. J., Watermann, J. F., M. Engebretson, Greenwald, R. A., K. Kauristie, Taylor, M. G. G. T., Frey, H. U., J. M. Bosqued (7645949), H. Frey, Fazakerley, A., H. Rème, R. Greenwald, P. Eglitis (7605143), Balogh, A., J.-M. Bosqued, T. Pulkkinen (7632374), A. Fazakerley, Strömme, A., M. N. Wild, J. A. Wild (7591442), H. Reme (7594538), I. W. McCrea (7594871), Bosqued, J.-M., H. Frey (7632359), Frey, H., M. F. Marcucci, S. K. Morley, P. Prikryl (7632365), G. Provan, H. Opgenoorth, Amm, O., C. Cully, G. Provan (7602020), Kauristie, K., Greenwald, R., Taylor, M., T. Pulkkinen, Marcucci, M. F., van Eyken, A. P., C. Cully (7632353), Prikryl, P., Blelly, P.-L., P.-L. Blelly, M. F. Marcucci (7632389), W. Denig (7632350)   +128 more
core   +1 more source

Comparative Evaluation of Hemodiafiltration, Hemoperfusion, and Standard Hemodialysis on Efficacy, Inflammatory Control, Dialysis Adequacy, and Safety in End‐Stage Renal Disease: A Prospective Observational Study

Therapeutic Apheresis and Dialysis, EarlyView.
ABSTRACT Background Chronic micro‐inflammation in patients with end‐stage renal disease (ESRD) is a significant driver of cardiovascular complications and diminished quality of life. While standard hemodialysis (SHD) effectively manages small‐molecule clearance, its ability to remove medium‐to‐large uremic toxins—the primary catalysts of systemic ...
Hongwei Zuo, Weisi Dai, Jie Mao, Mei Ye, Xingshan Lu, Xiaocui Zhang   +5 more
wiley   +1 more source

Single Event Transient Tolerance Analysis in 8051 Microprocessor Using Scan Chain

, 2016
As semi-conductor manufacturing technology evolves; the single event transient problem becomes more significant issue. Single event transient has a critical impact on both combinational and sequential logic circuits, so it is important to evaluate the ...
Jong Kang Park, Jun Sung Go, Jong Tae Kim   +2 more
core   +1 more source

Simulation of Single-event Irradiation Damage Effects on GaN-based LEDs

Yuanzineng kexue jishu
Light-emitting diodes (LEDs) as keydevices in the fields of space exploration and nuclear technology hold broad application prospects. However, in space applications, LEDs face challenges from the radiation environment, which poses a serious threat to ...
JIANG Rongyu1, WANG Zujun2, YANG Xin1, CHEN Minglei3, WANG Pensheng2
doaj   +1 more source

Safety of Daprodustat for the Treatment of Chronic Kidney Disease Anemia: Final Analysis of a Multicenter Postmarketing Surveillance Study in Japan

Therapeutic Apheresis and Dialysis, EarlyView.
ABSTRACT Introduction This final analysis of a multicenter, prospective postmarketing surveillance study evaluated the safety of daprodustat in patients with chronic kidney disease anemia in routine clinical practice in Japan. Methods Patients who initiated daprodustat between September 2020 and July 2022 were registered.
Tadao Akizawa, Kyomi Kanaya, Kiyomi Aizawa, Masanori Onoki, Hirofumi Ozeki, Kazuko Suzuki, Ai Hayashi, Tomohiko Asamura   +7 more
wiley   +1 more source

Pulse-Length Determination Techniques in the Rectangular Single Event Transient Fault Model [PDF]

, 2013
ISBN : 978-1-4799-0102-9International audienceOne of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model.
Kerkhoff, Hans G., Enrico Costenaro, Dan Alexandrescu, Kerkhoff, H., Rohani, A., Alexandrescu, D., Alireza Rohani, Alexandrescu, Dan, Costenaro, E., Hans G. Kerkhoff, costenaro, enrico   +10 more
core   +1 more source

Heavy Ion Single Event Effects in CMOS Image Sensors: SET and SEU

, 2023
High-energy particles in space often induce single event effects in CMOS image sensors, resulting in performance degradation and functional failure. This paper focuses on the formation and morphology of transient bright spots in CMOS image sensors and ...
Zhikang Yang, Jie Feng, Lin Wen, Bingkai Liu, Zitao Zhao, Qi Guo, Yudong Li, Dong Zhou   +7 more
core   +1 more source

Optimized Simulation Analysis for Single Event Transient in Nanoscale Logical Cells

Yuanzineng kexue jishu
Single event transient (SET) induced by high energy single particle radiation is the main threat to space application electronic system reliability.
WANG Tan,  DING Lili,  LUO Yinhong,  ZHAO Wen,  ZHANG Fengqi,  XU Jingyan
doaj   +1 more source