Results 11 to 20 of about 534 (215)
A Single-Event-Hardened Scheme for Ring Oscillator Applied to Radiation-Resistant PLL Microsystems
Micromachines, 2023 A voltage-controlled oscillator (VCO) is one of the key modules of the phase-locked loop (PLL) microsystem, and it is easy to bombard using high-energy particles in a radiation environment, resulting in the single-event effect.
Qi Xiang, Hongxia Liu, Yulun Zhou
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Modification of the LM124 Single Event Transients by Load Resistors [PDF]
IEEE Transactions on Nuclear Science, 2010 The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients.
Franco Peláez, Francisco Javier +3 more
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Active Radiation-Hardening Strategy in Bulk FinFETs
IEEE Access, 2020 In this article, we present a new method to mitigate the effect of the charge collected by trigate FinFET devices after an ionizing particle impact. The method is based on the creation of an internal structure that generates an electrical field that ...
Antonio Calomarde +3 more
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IET Circuits, Devices and Systems, 2021 Current mirror utilizing an extra transistor for single‐event‐induced charge dissipation is proposed. This technique involves two inverters and a dissipation transistor. The inverters are employed as a sensor that turns on the dissipation transistor when
Jingtian Liu +5 more
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Micromachines, 2023 In this paper, a single-event transient model based on the effective space charge for MOSFETs is proposed. The physical process of deposited and moving charges is analyzed in detail.
Yutao Zhang +5 more
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Design and Analysis of SEU Hardened Latch for Low Power and High Speed Applications
Journal of Low Power Electronics and Applications, 2019 Due to the reduction in technology scaling, gate capacitance and charge storage in sensitive nodes are rapidly decreasing, making Complementary Metal Oxide Semiconductor (CMOS) circuits more sensitive to soft errors caused by radiation.
Satheesh Kumar S, Kumaravel S
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Single event transient tolerant frequency divider
IET Computers & Digital Techniques, 2014 This study presents a single event upset (SEU) tolerant frequency divider that compares the counted number of rising clock edges with the expected value. The number of counted rising edges being less than expected generally implies that the state is corrupted resulting in faulty output, so the faulty frequency divider is reset to a proper state to ...
Xiaoxuan She, Ningxi Li
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On the mitigation of single event transients on flash-based FPGAs
2018 IEEE 23rd European Test Symposium (ETS), 2018 Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is becoming widely adopted in mission- and safety-critical applications, such as in aerospace field. However, the decreasing of device feature size leads to an increasing of the device sensitivity regarding Single Event Transients (SETs).
Sarah Azimi, Boyang Du, Luca Sterpone
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He jishu, 2021 BackgroundBipolar devices used in space radiation environment for a long time are simultaneously threatened by the total ionization dose (TID) effect and single event transient (SET), and there is a synergistic effect between TID and SET.
CAI Jiao +8 more
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Single-Event-Transient Resilient Memory for DSP in Space Applications [PDF]
2018 IEEE 23rd International Conference on Digital Signal Processing (DSP), 2018 We present a radiation-hardened-by-design (RHBD) memory design that mitigates Single-Event-Transients (SETs), Single-Event-Upsets (SEUs) and Dual-Event-Upsets (DEUs), hence significantly enhancing the reliability of digital signal processors (DSPs) for space applications.
Lwin, Ne Kyaw Zwa +5 more
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