Results 201 to 210 of about 117,391 (253)

Single Event Transient (SET) Mitigation Circuits With Immune Leaf Nodes

IEEE Transactions on Device and Materials Reliability, 2021
In a spacecraft, flip-flops take part in holding operational configuration for long durations. Single event transients (SETs) at control inputs of such flip-flops can culminate in single event upsets (SEUs). An SEU may cause loss of one or more mission objectives or service disruption or life reduction of the spacecraft.
Faisal Mustafa Sajjade, Neeraj Kumar Goyal, B. K. S. V. L. Varaprasad   +2 more
openaire   +1 more source

Reliability Evaluation of the Count Min Sketch (CMS) against Single Event Transients (SETs)

2021 IEEE 39th VLSI Test Symposium (VTS), 2021
Estimating the frequency of the elements in a data set is commonly needed in data analysis. With the increase of the size of the data sets, accurately computing the number of times that each element appears with a counter becomes impractical. Instead, the Count Min Sketch (CMS) is widely used in big data processing to estimate frequency due to its ...
Jinhua Zhu, Zhen Gao 0005, Jie Jin, Pedro Reviriego   +3 more
openaire   +1 more source

Simultaneous Single-Event Transient (SET) Observation on LM139A Wired-and Comparator Circuit

IEEE Transactions on Nuclear Science, 2021
The sensitivity of the LM139A quad voltage comparator toward simultaneous single-event transient has been investigated through laser single photon absorption. The results have been supported and compared to heavy-ion tests. The analysis of sensitivity leads to the observation of two sensitive cases related to internal charge-sharing mechanism between ...
S. Morand, C. Binois, H. Claret de Fleurieu, A. Carvalho, A. Samaras, T. Clatworthy, K. Kruckmeyer, M. Marin, R. Mangeret, G. Salvaterra, D. Staerk   +10 more
openaire   +1 more source

Development of a test methodology for single-event transients (SETs) in linear devices

IEEE Transactions on Nuclear Science, 2001
We present single-event transient (SET) test data on linear devices under many operational conditions in an attempt to understand the SET generation and characteristics. This is done in an attempt to define a low-cost conservative test methodology to characterize these effects.
C. Poivey, J.W. Howard, S. Buchner, K.A. LaBel, J.D. Forney, H.S. Kim, A. Assad   +6 more
openaire   +1 more source

Single Event Transients (SETs) in the RH108 Operational Amplifier in Analog Circuits

2006 IEEE Radiation Effects Data Workshop, 2006
The effect of various commercial power devices are presented. The devices have proved to be very fragile to single event effects, with some of the devices actually succumbing to catastrophic SEE with protons.
Rosa Chavez, Leif Scheick, Tetsuo Miyahira, Allan Johnston   +3 more
openaire   +1 more source

Critical charge for single-event transients (SETs) in bipolar linear circuits

IEEE Transactions on Nuclear Science, 2001
The critical charge for single-event transients (SETS) from heavy ions has been simulated and measured in bipolar linear circuits under several bias conditions. Although in many cases the threshold linear energy transfer is less than 2 MeV-cm/sup 2//mg, the minimum critical charge is of the order of 0.3-1 pC.
R.L. Pease, A. Sternberg, L. Massengill, R. Schrimpf, S. Buchner, M. Savage, J. Titus, T. Turflinger   +7 more
openaire   +1 more source

Analysis of Single-Event Transients (SETs) Using Machine Learning (ML) and Ionizing Radiation Effects Spectroscopy (IRES)

IEEE Transactions on Nuclear Science, 2021
A methodology for automating the identification of single-event transients (SETs) through ionizing radiation effects spectroscopy (IRES) and machine learning (ML) is provided. IRES enhances the identification of SETs through statistical analysis of waveform behavior, allowing for the capture of subtle circuit dynamics changes.
T. D. Loveless, D. R. Reising, J. C. Cancelleri, L. W. Massengill, D. McMorrow   +4 more
openaire   +1 more source

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527), 2002
The single event transient (SET) sensitivity of a radiation hardened voltage comparator type with vertical input transistors is compared with that observed for a COTS device type made up of lateral transistors. The cause of the difference in sensitivity is investigated.
R. Koga, S.H. Crain, K.B. Crawford, S.C. Moss, S.D. LaLumondiere, J.W. Howard   +5 more
openaire   +1 more source

A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients

Journal of Electronic Testing, 2014
As technology scales down, more single-event transients (SETs) are expected to occur in combinational circuits and thus contribute to the increase of soft error rate (SER). We propose a systematic analysis method to precisely model the SET latching probability.
Hoda Pahlevanzadeh, Qiaoyan Yu
openaire   +1 more source