Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty
Electronics (Switzerland), 2020Yaqing Chi, Jing Tian, Jianjun Chen
exaly
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor
Science China Information Sciences, 2017Jinxin Zhang +7 more
openaire +1 more source
The Inflection Point of Single Event Transient in SiGe HBT at a Cryogenic Temperature
Electronics (Switzerland), 2023Xiaoyu Pan, Liu Yinong, Guo Hongxia
exaly
Single event transient (SET) for a novel step-truncated SELBOX FinFET device
Analog Integrated Circuits and Signal ProcessingBaojun Liu, Jing Zhu
openaire +1 more source
Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain
Symmetry, 2020Yaqing Chi, Aq Wu, Chi Yaqing
exaly
SET-SAT: Susceptibility Analysis Tool of Single Event Transients for Combinational Cells
2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS)Mateus E. Pietro +2 more
openaire +1 more source
Analysis of location and LET dependence of single event transient in 14 nm SOI FinFET
Nuclear Instruments & Methods in Physics Research B, 2022Baojun Liu
exaly
The Effect of Deep N+ Well on Single-Event Transient in 65 nm Triple-Well NMOSFET
Symmetry, 2019Pengcheng Huang +2 more
exaly
On-Chip Characterization of Single-Event Transient Pulsewidths
IEEE Transactions on Device and Materials Reliability, 2006Ronald Schrimpf +2 more
exaly
A comprehensive analog single-event transient analysis methodology
IEEE Transactions on Nuclear Science, 2004M W Savage, J L Titus, C Poivey
exaly