Results 191 to 200 of about 312,838 (207)
Some of the next articles are maybe not open access.

Physical Mechanisms of Proton-Induced Single-Event Upset in Integrated Memory Devices

IEEE Transactions on Nuclear Science, 2019
Pablo Caron, Laurent Art
exaly  

Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

IEEE Transactions on Nuclear Science, 2008
Andrew L Sternberg   +2 more
exaly  

Device simulation of charge collection and single-event upset

IEEE Transactions on Nuclear Science, 1996
exaly  

Single Event Upset Testing with Relativistic Heavy Ions

IEEE Transactions on Nuclear Science, 1984
exaly  

Prevention of Single Event Upsets in Microelectronics

1991
B. L. Bhuva   +4 more
openaire   +1 more source

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