Results 81 to 90 of about 312,625 (306)

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory [PDF]

We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode.
Chen, Dakai, Kim, Hak, Label, Kenneth, Ladbury, Raymond, Phan, Anthony, Seidleck, Christina, Wilcox, Edward   +6 more
core   +1 more source

Characterizing SRAM Single Event Upset in Terms of Single and Double Node Charge Collection [PDF]

, 2008
A well-collapse source-injection mode for SRAM SEU is demonstrated through TCAD modeling. The recovery of the SRAM s state is shown to be based upon the resistive path from the p+-sources in the SRAM to the well.
Ball, D. R., II, Black, D. A., Black, J. D., Dodd, P. E., Fleetwood, D. M., Friendlich, M., Haddad, N. F., Kim, H., Reed, R. A., Robinson, W. H., Schrimpf, R. D., Tipton, A. D., Warren, K. M., Xapsos, M. A.   +13 more
core   +1 more source

Randomness in Competitions [PDF]

, 2012
We study the effects of randomness on competitions based on an elementary random process in which there is a finite probability that a weaker team upsets a stronger team.
Ben-Naim, E., Hengartner, N. W., Redner, S., Vazquez, F.   +3 more
core   +2 more sources

Conserved structural motifs in PAS, LOV, and CRY proteins regulate circadian rhythms and are therapeutic targets

FEBS Letters, EarlyView.
Cryptochrome and PAS/LOV proteins play intricate roles in circadian clocks where they act as both sensors and mediators of protein–protein interactions. Their ubiquitous presence in signaling networks has positioned them as targets for small‐molecule therapeutics. This review provides a structural introduction to these protein families.
Eric D. Brinckman, Anna E. Lester, Brian D. Zoltowski   +2 more
wiley   +1 more source

Effects of cosmic rays on single event upsets [PDF]

Assistance was provided to the Brookhaven Single Event Upset (SEU) Test Facility. Computer codes were developed for fragmentation and secondary radiation affecting Very Large Scale Integration (VLSI) in space.
Fogarty, T. N., Lowe, C. W., Olidapupo, A., Venable, D. D., Zajic, V.   +4 more
core   +1 more source

Radiation tolerant combinational logic cell [PDF]

, 2009
A system has a reduced sensitivity to Single Event Upset and/or Single Event Transient(s) compared to traditional logic devices. In a particular embodiment, the system includes an input, a logic block, a bias stage, a state machine, and an output.
Gambles, Jody W., Maki, Gary R., Whitaker, Sterling   +2 more
core   +1 more source

An upstream open reading frame regulates expression of the mitochondrial protein Slm35 and mitophagy flux

FEBS Letters, EarlyView.
This study reveals how the mitochondrial protein Slm35 is regulated in Saccharomyces cerevisiae. The authors identify stress‐responsive DNA elements and two upstream open reading frames (uORFs) in the 5′ untranslated region of SLM35. One uORF restricts translation, and its mutation increases Slm35 protein levels and mitophagy.
Hernán Romo‐Casanueva, Ariann E. Mendoza‐Martínez, P. Abril Medina‐Flores, Carlos Campero‐Basaldua, Alexander DeLuna, Soledad Funes   +5 more
wiley   +1 more source

Estimation method for bit upset ratio of NAND flash memory induced by heavy ion irradiation

AIP Advances
In order to estimate the bit upset ratio of NAND flash memory induced by heavy ion irradiation, starting from the physical mechanism of the bit upset of NAND flash memory, an analytical model based on statistical methods was developed to describe the ...
Jiangkun Sheng, Mengtong Qiu, Peng Xu, Lili Ding, Yinhong Luo, Zhibin Yao, Fengqi Zhang, Shilong Gou, Zujun Wang, Yuanyuan Xue   +9 more
doaj   +1 more source

Radiation Hardened NULL Convention Logic Asynchronous Circuit Design

Journal of Low Power Electronics and Applications, 2015
This paper proposes a radiation hardened NULL Convention Logic (NCL) architecture that can recover from a single event latchup (SEL) or single event upset (SEU) fault without deadlock or any data loss.
Liang Zhou, Scott C. Smith, Jia Di
doaj   +1 more source

A guideline for heavy ion radiation testing for Single Event Upset (SEU) [PDF]

A guideline for heavy ion radiation testing for single event upset was prepared to assist new experimenters in preparing and directing tests. How to estimate parts vulnerability and select an irradiation facility is described.
Malone, C., Nichols, D. K., Price, W. E.
core   +1 more source