Results 81 to 90 of about 312,838 (207)

Method and apparatus for increasing resistance of bipolar buried layer integrated circuit devices to single-event upsets [PDF]

, 1991
Bipolar transistors fabricated in separate buried layers of an integrated circuit chip are electrically isolated with a built-in potential barrier established by doping the buried layer with a polarity opposite doping in the chip substrate.
Zoutendyk, John A.
core   +1 more source

Goal Structured Notation in a Radiation Hardening Safety Case for COTS-Based Spacecraft [PDF]

A systematic approach is presented to constructing a radiation assurance case using Goal Structured Notation (GSN) for spacecraft containing COTS parts.
Austin, Rebekah, Evans, John, Karsai, Gabor, LaBel, Ken, Mahadevan, Nag, Reed, Robert, Sierawski, Brian, Witulski, Arthur   +7 more
core   +1 more source

Statistically-secure ORAM with $\tilde{O}(\log^2 n)$ Overhead

, 2013
We demonstrate a simple, statistically secure, ORAM with computational overhead $\tilde{O}(\log^2 n)$; previous ORAM protocols achieve only computational security (under computational assumptions) or require $\tilde{\Omega}(\log^3 n)$ overheard.
B. Pinkas, C. Gentry, D.L. Eager, E. Shi, I. Damgård, M. Maas, M. Mitzenmacher, M. Mitzenmacher, M. Mitzenmacher, N.D. Vvedenskaya, O. Goldreich, P. Lezaud, S. Lu   +12 more
core   +1 more source

Synergistic Effect of TID and SEE in 130 nm 7T SOI SRAM

Yuanzineng kexue jishu
The space environment is a very harsh operating environment, and space radiation can directly affect the operation of electronic devices causing total ionizing dose (TID), single event effect (SEE) and displacement damage (DD).
XIAO Shuyan1, GUO Gang1, WANG Linfei2, ZHANG Zheng1, CHEN Qiming1, GAO Linchun2, WANG Chunlin2, ZHANG Fuqiang1, ZHAO Shuyong1, LIU Jiancheng1
doaj   +1 more source

College Football Games and Crime [PDF]

, 2008
There is a great deal of anecdotal evidence that college football games can lead to aggressive and destructive behavior by fans. However, to date, no empirical study has attempted to document the magnitude of this phenomenon.
Rees, Daniel I, Schnepel, Kevin T
core   +1 more source

Atmospheric neutron inducing single event effects on AI chips manufacturing with 8 nm FinFET

Nuclear Engineering and Technology
--With the rapid advancement of artificial intelligence (AI) chips in diverse applications, single event effects (SEE) caused by high energy particles in ambient environment have emerged as a critical concern.
Yonghong Li, Jianan Tong, Weitao Yang, Zhiliang Hu, Lihua Mo, Tianjiao Liang, Chaohui He, Jinghui Lan   +7 more
doaj   +1 more source

Evaluating application vulnerability to soft errors in multi-level cache hierarchy [PDF]

, 2011
As the capacity of cache increases dramatically with new processors, soft errors originating in cache has become a major reliability concern for high performance processors.
Carlson, Trevor, Eeckhout, Lieven, Heirman, Wim, Ma, Zhe   +3 more
core   +1 more source

The physics of a single-event upset in integrated circuits: A review and critique of analytical models for charge collection [PDF]

When an energetic particle (kinetic energy 0.5 MeV) originating from a radioactive decay or a cosmic ray transverse the active regions of semiconductor devices used in integrated circuit (IC) chips, it leaves along its track a high density electron hole
Vonroos, O., Zoutendyk, J.
core   +1 more source

A multi-node-upset-resilient 14T SRAM with high read stability for space applications

Nuclear Engineering and Technology
This paper proposes a voltage-booster read-decoupled radiation-hardened 14T (BDRH14T) SRAM cell. In harsh environments such as space, radiation can flip the stored data in memory cells, resulting in soft errors, including single-event upset (SEU) and ...
Sung-Jun Lim, Sung-Hun Jo
doaj   +1 more source