Results 161 to 170 of about 16,144 (237)

Estimation of Single Event Upset (SEU) rates inside the SAA during the geomagnetic storm event of 15 May 2005

International Conference on Wireless for Space and Extreme Environments, 2021
In this study, we assessed the Single Event Upset (SEU) rates of a LEO mission due to its passage in the South Atlantic Anomaly (SAA) during a geomagnetic storm.
Kirolosse M. Girgis, Tohru Hada, Shuichi Matsukiyo   +2 more
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Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022
The modeling process, when validated with the experimental data, can be used for additional analysis of similar technologies without the expense of laser beam or heavy ion testing.
Semiu A. Olowogemo, Hao Qiu, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick   +4 more
openalex   +2 more sources

An Adaptive Single Event Upset (SEU)-Hardened Flip-Flop Design

International Conference on Electron Devices and Solid-State Circuits, 2019
In this paper, a new radiation hardened flip-flop design technique is proposed. The structure provides an possibility that the D-type flip-flop can be configured as an Single Event Upset (SEU) hardened or non-hardened flip-flop in a circuit based on the ...
Man Zhang, Zhongjie Guo, WanCheng Xu
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Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

IEEE Transactions on Nuclear Science, 1983
Donald K. Nichols, William E. Price, C. J. Malone   +2 more
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Single-Event Upset (SEU) Results of Embedded Error Detect and Correct Enabled Block Random Access Memory (Block RAM) Within the Xilinx XQR5VFX130

IEEE Transactions on Nuclear Science, 2010
Gregory R. Allen, Larry D. Edmonds, Chen Wei Tseng, G.M. Swift, C. Carmichael   +4 more
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Experimental Evidence for a New Single-Event Upset (SEU) Mode in a CMOS SRAM Obtained from Model Verification

IEEE Transactions on Nuclear Science, 1987
J. A. Zoutendyk, L. S. Smith, George Soli, R. Y. Lo   +3 more
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Total-dose and single-event-upset (SEU) resistance in advanced SRAMs fabricated on SOI using 0.2 μm design rules

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588), 2002
Kazuyuki Hirose, Hirobumi Saito, M. Akiyama, Makiko Arakaki, Yoshihiro Kuroda, S. Ishii, K. Nakano   +6 more
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Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL)

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2021
this paper examines the single-event latchup (SEL) and single event upset (SEU) response of the Xilinx 7nm XCVC1902 ES1 Versal ACAP Programmable Logic irradiated with neutrons and 64 MeV protons sources.
Pierre Maillard, Yanran P. Chen, Jeff Barton, M. Voogel   +3 more
semanticscholar   +1 more source

Notice of Violation of IEEE Publication Principles: Selective Triple Modular Redundancy for Single Event Upset (SEU) Mitigation

NASA/ESA Conference on Adaptive Hardware and Systems, 2009
Xiaoxuan She, P.K. Samudrala
openalex   +2 more sources