Results 151 to 160 of about 264 (165)
Some of the next articles are maybe not open access.

Single-Event-Upset (SEU) Mitigation Techniques for Routing Resources of SRAM-FPGA

International Journal of Advancements in Computing Technology, 2012
Cheng Gao -, Wei Guo -, Jiaoying Huang -
openaire   +1 more source

Fault tolerant techniques to diagnose and mitigate Single Event Upset (SEU) effects on electronic programmable devices

2008
This research faces the problem of disturbance induced by high energy particles on electronic devices. Based on detailed analysis of this phenomenon, the work is divided into two parts: in the first part testing of the Single Event Upset (SEU) has been carried out with the aim of determining diagnostic techniques and the mitigation of this disturbance,
CIANI, LORENZO   +2 more
openaire   +1 more source

Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

IEEE Transactions on Nuclear Science, 2008
Marcus Mendenhall   +2 more
exaly  

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, 2018
Hak Kim, Ray Ladbury, Dakai Chen
exaly  

Single Event Upset cross sections at various data rates

IEEE Transactions on Nuclear Science, 1996
Stephen Büchner, R A Reed, M A Carts
exaly  

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
W T Holman, D R Ball, B L Bhuva
exaly  

Computational method to estimate Single Event Upset rates in an accelerator environment

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2000
F Faccio
exaly  

Single-Event-Upset Tolerant RS Flip-Flop with Small Area

IEICE Transactions on Information and Systems, 2010
Hideo Itô
exaly  

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