Results 161 to 165 of about 264 (165)

Single event upset (SEU) mitigation for FinFET technology using fin topology

2017
openaire   +2 more sources

Selective Triple Modular Redundancy for Single Event Upset (SEU) Mitigation.

openaire   +1 more source

Neutron Induced Single Event Upset (SEU) Testing of Commercial Flash Memory Devices with and without Embedded Error Correction Codes (ECC)

2019
exaly  

Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link

2000
Dinkespiler, B., Stroynowski, R., Xie, S., Ye, J., Andrieux, M.L., Gallin-Martel, L., Lundquist, J., Pearce, M., Rydstrom, S., Rethore, F.   +9 more
openaire   +1 more source

Total-dose and single-event-upset (SEU) resistance in advanced SRAMs fabricated on SOI using 0.2 μm design rules

exaly