Results 171 to 180 of about 10,587 (214)
A Novel Scheme for Tolerating Single Event/Multiple Bit Upsets (SEU/MBU) in Non-Volatile Memories
IEEE Transactions on Computers, 2016 This paper proposes a novel scheme for a low-power non-volatile (NV) memory that exploits a two-level arrangement for attaining single event/multiple bit upsets (SEU/MBU) tolerance. Low-power hardened NVSRAM cell designs are initially utilized at the first level; these designs increase the critical charge and decrease power consumption by providing a ...
Wei Wei 0034 +3 more
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Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions.
, 1988 Abstract : JPL and Aerospace have collected an extensive set of heavy ion single event upset (SEU) test data since their joint publication in December 1985. This report presented trends in SEU susceptibility for state-of-the-art parts. An ongoing single event upset (SEU) program at JPL and the Aerospace Corporation is continuing in order to assess ...
W. A. Kolasinski +4 more
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Ion beam induced charge collection (IBICC) microscopy of ICs: relation to single event upsets (SEU)
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1993 Abstract Single event upset (SEU) imaging is a new diagnostic technique recently developed using Sandia's nuclear microprobe. This technique directly images, with micron resolution, those regions within an integrated circuit which are susceptible to ion-induced malfunctions. Such malfunctions are an increasing threat to space-based systems which make
K.M. Horn +6 more
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2009 NASA/ESA Conference on Adaptive Hardware and Systems, 2009 This paper represents a design technique for hardening circuits mapped onto FPGAs. An effective and simple algorithm for signal probabilities has been used to detect SEU (single event upset) sensitive gates for a given circuit. The circuit can be hardened against radiation effects by applying triple modular redundancy (TMR) technique to only these ...
Xiaoxuan She, P.K. Samudrala
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Single event upset (SEU): Diagnostic and error correction system for avioncs device
, 2009 In aerospace applications, Commercial-Off-The-Shelf (COTS) Field programmable Gate Array (FPGA) is becoming increasingly attractive by offering low-cost solutions, simplicity and flexibility. This research faces the problem of disturbance induced by high energy particles on electronic devices.
CIANI, LORENZO +2 more
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Efficient protection of polar decoders against Single Event Upsets (SEUs) on user memories
Microelectronics Reliability, 2023 Dong Tian +5 more
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Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2022 Semiu A. Olowogemo +4 more
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