Results 191 to 200 of about 10,587 (214)

SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

1986
Abstract : A detailed analysis of the SEU vulnerability of the Zilog Z-80 microprocessor is presented based upon data obtained with heavy ions and protons. The analysis demonstrates a method for separating upsets of the general purpose registers from upsets of the internal latches.
J. Cusick, C. King, W. A. Kolasinski, R. Koga   +3 more
openaire   +1 more source

Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM

IEEE Transactions on Nuclear Science, 1985
Single-Event Upset (SEU) response of a bipolar low-power Schottky-diode-clamped TTL static RAM has been observed using Br ions in the 100-240 MeV energy range and 0 ions in the 20-100 MeV range. These data complete the experimental verification of circuit-simulation SEU modeling for this device.
J. A. Zoutendyk, L. S. Smith, G. A. Soli, P. Thieberger, H. E. Wegner   +4 more
openaire   +1 more source

Neutron Induced Single Event Upset (SEU) Testing of Commercial Memory Devices with Embedded Error Correction Codes (ECC)

2017 IEEE Radiation Effects Data Workshop (REDW), 2017
Results of neutron induced single event upset testing of devices with embedded error correction codes are described. Specifically, Cypress CY7C1061GE30-10BVXI and CY7C1061GE-10BVXI 16-Mbit Static Random Access Memories (SRAMs), and a memory system, consisting of a Tundra Tsi107 PowerPC Host Bridge interfacing with nine Micron MT48LC32M8A2TG-75ITD 256 ...
John M. Bird, Michael K. Peters, Travis Z. Fullem, Michael J. Tostanoski, Terrence F. Deaton, Kristianto Hartojo, Roy E. Strayer   +6 more
openaire   +1 more source

Single-Event-Upset (SEU) Mitigation Techniques for Routing Resources of SRAM-FPGA

International Journal of Advancements in Computing Technology, 2012
Cheng Gao -, Wei Guo -, Jiaoying Huang -
openaire   +1 more source

Critical Charge Dependency of Single Event Upset (SEU) on the Supply Voltage in Nanometric CMOS SRAMs

2022 Iranian International Conference on Microelectronics (IICM), 2022
Masume Soleimaninia, Gholamreza Raisali, Amir Moslehi   +2 more
openaire   +1 more source

Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL)

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2021
Pierre Maillard, Yanran P. Chen, Jeff Barton, Martin L. Voogel   +3 more
openaire   +1 more source

Fault tolerant techniques to diagnose and mitigate Single Event Upset (SEU) effects on electronic programmable devices

2008
This research faces the problem of disturbance induced by high energy particles on electronic devices. Based on detailed analysis of this phenomenon, the work is divided into two parts: in the first part testing of the Single Event Upset (SEU) has been carried out with the aim of determining diagnostic techniques and the mitigation of this disturbance,
CIANI, LORENZO, CATELANI, MARCANTONIO, L. Veltroni   +2 more
openaire   +1 more source

Selective Triple Modular Redundancy for Single Event Upset (SEU) Mitigation.

2023
openaire   +1 more source

Total-dose and single-event-upset (SEU) resistance in advanced SRAMs fabricated on SOI using 0.2 μm design rules

, 2002
Kazuyuki Hirose, Hirobumi Saito, M. Akiyama, Makiko Arakaki, Yoshihiro Kuroda, S. Ishii, K. Nakano   +6 more
openalex   +1 more source

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, 2018
Dakai Chen, Edward P Wilcox, R Ladbury
exaly