Results 201 to 210 of about 10,587 (214)

Time frequency analysis and Hilbert-Huang Transform (HHT) of single event upset (SEU) in FORMOSAT-2 and FORMOSAT-3 missions

, 2011
Tsung Ping Lee, Chen Chou Fong, Shan Kuo Yang, His Mao Tseng, Cheng Chung Huang, Way Jin Chen, Chao Yen Chen, I. Te Lee, Jann Yeng Liu   +8 more
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Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
B L Bhuva, L W Massengill, W T Holman
exaly  

Computational method to estimate Single Event Upset rates in an accelerator environment

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2000
F Faccio
exaly  

Using Classical Reliability Models and Single Event Upset (SEU) Data to Determine Optimum Implementation Schemes for Triple Modular Redundancy (TMR) in SRAM-Based Field Programmable Gate Array (FPGA) Devices

, 2015
Menachem Berg, H. Kim, A. Phan, C.M. Seidleck, Kenneth A. LaBel, Jonathan A. Pellish, Michael J. Campola   +6 more
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Single Event Upset cross sections at various data rates

IEEE Transactions on Nuclear Science, 1996
R A Reed, M A Carts, P W Marshall
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An SEU (single event upset) tolerant memory cell derived from fundamental studies of SEU mechanisms in SRAM (static random access memories)

, 1987
H. T. Weaver, Carl L. Axness, J. D. McBrayer, J.S. Browning, J.S. Fu, A. Ochoa, R. Koga   +6 more
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Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

IEEE Transactions on Nuclear Science, 2008
David F Heidel, Paul W Marshall, Kenneth A Label   +2 more
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VHDL Simulation considering Single Event Upsets (SEUs)

, 2006
M. Grecki
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Cosmic Radiation at Aircraft Altitudes (neutrons) Influences on the Single Event Upset SEU Sensitivity for Low-Voltage Electronic Devices

, 1998
Svensson, Christer
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Single Event Upset (SEU) testing of semiconductor components at the McMaster Accelerator Laboratory

, 1991
Joseph Davies, F.J.D. Almeida, D. Comedi, J.W.B. Stark   +3 more
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