Results 131 to 140 of about 8,001,430 (204)

A compact instrument for gamma-ray burst detection on a CubeSat platform II: Detailed design, assembly and validation. [PDF]

Exp Astron (Dordr), 2022
Murphy D, Ulyanov A, McBreen S, Mangan J, Dunwoody R, Doyle M, O'Toole C, Thompson J, Reilly J, Walsh S, Shortt B, Martin-Carrillo A, Hanlon L.   +12 more
europepmc   +1 more source

Current Transients in Graphene Electronics under Single-Particle Irradiation. [PDF]

Small Sci, 2023
He W, Zhai L, Yam CY, Xu Z.
europepmc   +1 more source

A high-performance onboard computing architecture for autonomous satellite mission planning. [PDF]

Sci Rep
Rao J, Zhao W, Ma M, Xue G, Zhang J, Li S, Zhu Y, An J.   +7 more
europepmc   +1 more source

Engineering error correcting dynamics in nanomechanical systems. [PDF]

Sci Rep
Jin X, Baker CG, Romero E, Mauranyapin NP, Hirsch TMF, Bowen WP, Harris GI.   +6 more
europepmc   +1 more source

SEU ground and flight data in static random access memories

This paper presents the vulnerabilities of single event effects (SEEs) simulated by heavy ions on ground and observed oil SJ-5 research satellite in space for static random access memories (SRAMs). A single event upset (SEU) prediction code has been used
Cai, JR, Duan, JL, Huang, Z, Jin, YF, Ye, ZH, Lin, YL, Liu, J, Wang, ZG, Hou, MD, Sun, YM, Yao, HJ, Zhang, QX, Mo, D, Han, JW   +13 more
core  

Investigation on High-Temperature and High-Field Reliability of NMOS Devices Fabricated Using 28 nm Technology After Heavy-Ion Irradiation. [PDF]

Micromachines (Basel)
Cao Y, Zhang Z, Zhang L, Li M, Su S, Zhang W, Xu Y, Huang D, Liu L, Lv L, Ma X.   +10 more
europepmc   +1 more source

A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays. [PDF]

Sensors (Basel)
Wang W, Li X, Chen L, Sun H, Zhang F.
europepmc   +1 more source

Evaluation of Single-Event Effect Current-Carrier Mapping Based on Experimental Data. [PDF]

Micromachines (Basel)
Bao M, Wang Y, Yang J, Li X.
europepmc   +1 more source

Radiation exposure to deep brain stimulation leads during multiple cranial radiation courses: illustrative case. [PDF]

J Neurosurg Case Lessons
Azghadi A, O'Carroll K, Perlow HK, Staudt MD.   +3 more
europepmc   +1 more source

Corner Simulation of CMOS Analog Integrated Circuit Taking into Account Radiation Influence. [PDF]

Micromachines (Basel)
Ryzhov S, Kuznetsov V, Andreev V.
europepmc   +1 more source