Incidence and Predictors of Cardiac Implantable Electronic Devices Malfunction with Radiotherapy Treatment. [PDF]
Azraai M +4 more
europepmc +1 more source
Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs Semiconductor. [PDF]
Neuhold I +6 more
europepmc +1 more source
SEU (single-event-upset) characterization of a hardened CMOS 64K and 256K SRAM
F.W. Sexton +5 more
openalex +1 more source
A high-performance onboard computing architecture for autonomous satellite mission planning. [PDF]
Rao J +7 more
europepmc +1 more source
SRAM Cell Design Challenges in Modern Deep Sub-Micron Technologies: An Overview. [PDF]
Gul W, Shams M, Al-Khalili D.
europepmc +1 more source
Single-Particle Irradiation Effect and Anti-Irradiation Optimization of a JLTFET with Lightly Doped Source. [PDF]
Xie H, Liu H.
europepmc +1 more source
First Evaluation of the Single Event Upset (SEU) Risk for Electronics in the CMS Experiment
F. Faccio, M. Huhtinen, C. Detcheverry
openalex +1 more source
Investigation on High-Temperature and High-Field Reliability of NMOS Devices Fabricated Using 28 nm Technology After Heavy-Ion Irradiation. [PDF]
Cao Y +10 more
europepmc +1 more source

