Results 121 to 130 of about 264 (165)

Empirical Modeling of Single-Event Upset (SEU) in NMOS Depletion-Mode-Load Static RAM (SRAM) Chips

IEEE Transactions on Nuclear Science, 1986
A detailed experimental investigation of single-event upset (SEU) in static RAM (SRAM) chips fabricated using a family of high-performance NMOS (HMOS) depletion-mode-load process technologies, has been done. Empirical SEU models have been developed with the aid of heavy-ion data obtained with a three-stage tandem van de Graaff accelerator.
J. A. Zoutendyk, L. S. Smith, G. A. Soli, S. L. Smith, G. E. Atwood, P. Thieberger   +5 more
exaly   +2 more sources

Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs

IEEE Transactions on Nuclear Science, 2004
We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets (SEUs). The signal probabilities of the lines can be used to detect SEU sensitive subcircuits of a given combinational circuit.
Srinivas Katkoori
exaly   +2 more sources

Single Event Upset (SEU) Mitigation Techniques

2006
exaly   +2 more sources

Estimation of Single Event Upset (SEU) rates inside the SAA during the geomagnetic storm event of 15 May 2005

2021 IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE), 2021
Kirolosse M Girgis, Shuichi Matsukiyo, Tohru Hada   +2 more
exaly   +2 more sources

Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on Memories in Polar Decoders

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021
Polar codes are used in 5G system for the transmission of control channels due to its excellent error correction capability for short sequence, and CRC assistant successive cancellation list (CA-SCL) decoders are commonly used in practical system. When applied in critical environment, e.g. space platform, the memories in the hardware polar decoder will
Zhen Gao 0005, Ruize Wang, Haoyu Du, Pedro Reviriego   +3 more
openaire   +1 more source

Single-Event-Upset (SEU) Awareness in FPGA Routing

2007 44th ACM/IEEE Design Automation Conference, 2007
The majority of configuration bits affecting a design are devoted to FPGA routing configuration. We present a SEU-aware routing algorithm that provides significant reduction in bridging faults caused by SEUs. Depending on the routing architecture switches, for MCNC benchmarks, the number of care bits can be reduced between 13% and 19% on average with ...
Shahin Golshan, Elaheh Bozorgzadeh
openaire   +1 more source

Modeling dynamic stability of SRAMS in the presence of single event upsets (SEUs)

2008 IEEE International Symposium on Circuits and Systems, 2008
SRAM yield is very important from an economics viewpoint, because of the extensive use of memory in modern processors and SOCs. Therefore, SRAM stability analysis tools have become essential. SRAM stability analysis based on static noise margin (SNM) often results in pessimistic designs because SNM cannot capture the transient behavior of the noise ...
Rajesh Garg, Peng Li 0001, Sunil P. Khatri   +2 more
openaire   +1 more source

Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices

7th International Symposium on Quality Electronic Design (ISQED'06), 2006
This paper presents a unique SEU (single event upset) mitigation technique based upon temporal data sampling for synchronous circuits and configuration bit storage for programmable devices. The design technique addresses both conventional static SEUs and SETs (single event transients) induced errors that can result in data loss for reconfigurable ...
Sajid Baloch, Tughrul Arslan, Adrian Stoica   +2 more
openaire   +1 more source

The Single Event Upset (SEU) Response to 590 MeV Protons

IEEE Transactions on Nuclear Science, 1984
A recent test of ten device types exposed to 590 MeV protons at SINR (Swiss Institute of Nuclear Research, Villigen) is presented to clarify the picture of SEU response to higher energy protons, such as those found in galactic cosmic rays, solar flares and trapped radiation belts.
D. K. Nichols, W. E. Price, L. S. Smith, G. A. Soli   +3 more
openaire   +1 more source

Investigation of single-event upset (SEU) in an advanced bipolar process

IEEE Transactions on Nuclear Science, 1988
An extensive analytical and experimental study of SEU in an advanced silicon bipolar process was made. The modeling used process and device parameters to model the SEU charge, collection, and circuit response derived from a special version of PISCES in cylindrical coordinates and SPICE, respectively. Data are reported for test cells of various sizes. >
J.A. Zoutendyk, E.C. Secrest, D.F. Berndt   +2 more
openaire   +1 more source