Results 121 to 130 of about 962 (213)

An Examination of Environment Perturbation Effects on Single Event Upset Rates [PDF]

, 1997
This paper presents an analysis of the sensitivity of single event upset (SEU) rate predictions to changes in the direct ionization-inducing environment.
Leidecker, Henning W., Lewis, Mark J., Gates, Michele M.   +2 more
core   +1 more source

A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design. [PDF]

Micromachines (Basel), 2022
Yan A, Wei S, Chen Y, Fan Z, Huang Z, Cui J, Girard P, Wen X.   +7 more
europepmc   +1 more source

A critical examination of charge funneling and its impact on single-event upset in Si devices [PDF]

, 1994
Low-energy alpha particles emitted from packaging and high-energy heavy ions in space possess the capability of causing changes in memory state when incident on semiconductor memory cans and latch circuits.
Winokur, P. S., Sexton, F. W., Dodd, P. E.   +2 more
core  

Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs [PDF]

, 2013
SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of ...
CASSANO, LUCA MARIA
core  

A guideline for heavy ion radiation testing for Single Event Upset (SEU) [PDF]

, 1984
A guideline for heavy ion radiation testing for single event upset was prepared to assist new experimenters in preparing and directing tests. How to estimate parts vulnerability and select an irradiation facility is described.
Price, W. E., Nichols, D. K., Malone, C.
core   +1 more source

Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. [PDF]

Materials (Basel), 2023
Ellakany A, Zekry A, Zekry A, Abouelatta M, Shaker A, Sayah GT, El-Banna MM.   +6 more
europepmc   +1 more source

Effect of Total Dose Irradiation on Parasitic BJT in 130 nm PDSOI MOSFETs. [PDF]

Micromachines (Basel), 2023
Jia Y, Zhang Z, Bi D, Hu Z, Zou S.
europepmc   +1 more source

MRNG: Accessing Cosmic Radiation as an Entropy Source for a Non-Deterministic Random Number Generator. [PDF]

Entropy (Basel), 2023
Kutschera S, Slany W, Ratschiller P, Gursch S, Dagenborg H.   +4 more
europepmc   +1 more source

Revolutionizing nanosatellites' data integrity with SEEnet: A real-time ensemble learning approach for Single-Event Effect (SEE) prediction. [PDF]

PLoS One
Karim S, Tusher EH, Rahman A, Rabbi RI, Anwar KO, Othman KR.   +5 more
europepmc   +1 more source

High-Performance and Flexible Design Scheme with ECC Protection in the Cache. [PDF]

Micromachines (Basel), 2022
Zhou Y, Liu H, Xiang Q, Yin C.
europepmc   +1 more source