Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. [PDF]
Ellakany A +6 more
europepmc +1 more source
We present new data in the ongoing effort to bound the effect of proton angle of incidence on the single-event upset (SEU) rate in silicon-on-sapphire (SOS) and silicon-on-insulator (SOI ...
McCabe, J. F. +9 more
core
Investigating the impact of irradiation on various ringFET-based SRAM circuits using 3D TCAD. [PDF]
Anandhi R, Nagarajan KK, Ramya M.
europepmc +1 more source
Pion Induced Single Event Upset in the CMS Pixel Detector Readout
Single event upset probabilities for 200 MeV pions are compared for SRAM devices implemented in two different radiation hard SOI ...
Gabathuler, Kurt +3 more
core
Single Event Upset Studies on the APV6 Front End Readout Chip J Fulcher
The microstrip tracker for the CMS experiment at the LHC will be read out using radiation hard APV chips. During high luminosity running of the LHC the tracker will be exposed to particle fluxes up to 10 .
J Fulcher +10 more
core
Effect of Total Dose Irradiation on Parasitic BJT in 130 nm PDSOI MOSFETs. [PDF]
Jia Y, Zhang Z, Bi D, Hu Z, Zou S.
europepmc +1 more source
Reliability-Oriented Multi-Class Fault-Injection Acceleration for Digital Integrated Circuits via Heterogeneous Spatio-Temporal Graph Learning. [PDF]
Lu J +7 more
europepmc +1 more source
MRNG: Accessing Cosmic Radiation as an Entropy Source for a Non-Deterministic Random Number Generator. [PDF]
Kutschera S +4 more
europepmc +1 more source
Revolutionizing nanosatellites' data integrity with SEEnet: A real-time ensemble learning approach for Single-Event Effect (SEE) prediction. [PDF]
Karim S +5 more
europepmc +1 more source
High-Performance and Flexible Design Scheme with ECC Protection in the Cache. [PDF]
Zhou Y, Liu H, Xiang Q, Yin C.
europepmc +1 more source

