Single event upset (SEU) detection and correcting system using partial reconfiguration and scrubbing for military and space applications [PDF]
, 2006 The Field Programmable Gate Arrays (FPGAs) devices are new technology for military and aerospace applications. Re-programmability feature of these devices allow the user to change the internal configured logic based on new system requirements.
Safarian, Carlo
core
A Portable, Compact, and Fault-Tolerant Processor for Spaceflight Applications
AerospaceThis paper presents the Goddard RISC-V (GRV) a compact, portable, and highly customizable fault-tolerant 32-bit RISC-V processor, specifically designed for embedded space applications. The design integrates advanced fault-tolerance mechanisms to mitigate
David Guzman-Garcia +7 more
doaj +1 more source
Single event upset studies for the ATLAS SCT and pixel optical links [PDF]
, 2000 Optical data transmission has been chosen for the ATLAS Pixel and SemiConductor Tracker to deliver both timing and control information to the detector modules and transmit tracking data to the remote computer room.
Gregor, I M +16 more
core +1 more source
Radiation-Hardened 16T SRAM Cell with Improved Read and Write Stability for Space Applications
Applied SciencesThe critical charge of sensitive nodes decreases as transistors scale down with the advancement of CMOS technology, making SRAM cells more susceptible to soft errors in the space industry.
Jong-Yeob Oh, Sung-Hun Jo
doaj +1 more source
Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag [PDF]
, 2020 -We investigate the single event upset (SEU) and total ionizing dose (TID) tolerance of FeRAMs fabricated in 180-nm technology against neutron and gamma-ray radiation. Our irradiation tests reveal that the FeRAM has an SEU rate of less than 8.5 10 -3 FIT/
Taiki Uemura, Masanori Hashimoto
core
Physical Mechanisms of Proton-Induced Single-Event Upset in Integrated Memory Devices [PDF]
, 2018 International audienceThe sensitivity of memory devices under proton irradiation has been extensively studied over the years. Two main mechanisms have been identified to drive the single-event upset (SEU) sensitivity in the last generation of devices ...
Bezerra, F. +4 more
core +1 more source
A Comprehensive Methodology for Soft Error Rate (SER) Reduction in Clock Distribution Network
ChipsSingle Event Transients (SETs) in clock-distribution networks are a major source of soft errors in synchronous systems. We present a practical framework that assesses SET risk early in the design cycle, before layout and parasitics, using a Vulnerability
Jorge Johanny Saenz-Noval +2 more
doaj +1 more source
From vulnerability to robustness: Radiation-hard isolation for BPR-enabled stacked nanosheet CFETs
Nuclear Engineering and TechnologyThe integration of Buried Power Rail (BPR) and Complementary FET (CFET) technologies is a promising way to improve power efficiency and circuit density in advanced logic devices.
Dongwook Kim +4 more
doaj +1 more source
Dynamic partial reconfiguration scheme for fault-tolerant FFT processor based on FPGA
The Journal of Engineering, 2019 The fast Fourier transform FFT processor is an important part of the space real-time signal processing system based on field programmable gate array (FPGA).
Xin Wei, Yi Z Xie, Yu Xie, He Chen
doaj +1 more source
RHLP-18T: A Radiation-Hardened 18T SRAM with Enhanced Read Stability and Low Power Consumption
Applied SciencesElectronic equipment in space is constantly exposed to high-energy particles, which can induce Single Event Upsets (SEUs) in memory components, threatening system reliability.
Han-Gyeol Kim, Sung-Hun Jo
doaj +1 more source