estar: An R package to measure ecological stability
Methods in Ecology and Evolution, Volume 17, Issue 4, Page 1090-1100, April 2026.Abstract Assessing ecological stability is a key task in biodiversity monitoring and conservation. Quantifying stability is not trivial because its different aspects can be measured with various properties. However, to date, no software enables measuring different stability properties on ecological time‐series data.
Ludmilla Figueiredo +6 more
wiley +1 more source
Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory [PDF]
We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode.
Chen, Dakai +6 more
core +1 more source
Method and apparatus for increasing resistance of bipolar buried layer integrated circuit devices to single-event upsets [PDF]
, 1991 Bipolar transistors fabricated in separate buried layers of an integrated circuit chip are electrically isolated with a built-in potential barrier established by doping the buried layer with a polarity opposite doping in the chip substrate.
Zoutendyk, John A.
core +1 more source
Nuclear Engineering and TechnologyThis paper investigates the Single Event Upset (SEU) sensitivity, system-level hardening effectiveness, and potential applications of high-performance 16 nm Field Programmable Gate Arrays (FPGAs) in radiation environments.
Chang Cai +11 more
doaj +1 more source
Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing [PDF]
The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands
Coss, James R. +4 more
core +1 more source
Design and qualification of the SEU/TD Radiation Monitor chip [PDF]
This report describes the design, fabrication, and testing of the Single-Event Upset/Total Dose (SEU/TD) Radiation Monitor chip. The Radiation Monitor is scheduled to fly on the Mid-Course Space Experiment Satellite (MSX).
Blaes, Brent R. +4 more
core +1 more source
USING THE SOCHI STAND TO CONFIRM THE IMMATIBILITY OF THE INTEGRATED CIRCUIT
Безопасность информационных технологийThe paper analyzes the possible to apply of the SOCHI stand for the purpose of controlling the immutability of the chip`s topology in order trust (in reliable and safe operation).
Dmitry V. Bobrovsky +6 more
doaj +1 more source
Radiation-Hardened 16T SRAM Cell with Improved Read and Write Stability for Space Applications
Applied SciencesThe critical charge of sensitive nodes decreases as transistors scale down with the advancement of CMOS technology, making SRAM cells more susceptible to soft errors in the space industry.
Jong-Yeob Oh, Sung-Hun Jo
doaj +1 more source
Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report [PDF]
The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C.
Berg, Melanie D. +6 more
core +1 more source
Development of the analog ASIC for multi-channel readout X-ray CCD camera
, 2011 We report on the performance of an analog application-specific integrated circuit (ASIC) developed aiming for the front-end electronics of the X-ray CCDcamera system onboard the next X-ray astronomical satellite, ASTRO-H.
Awaki +25 more
core +1 more source