Results 81 to 90 of about 962 (213)
Investigation of Radiation Hardened TFET SRAM Cell for Mitigation of Single Event Upset
IEEE Journal of the Electron Devices Society, 2020 This study analyzes the soft error sensitivity of SRAM cell which employs double-gate tunnel field effect transistor (DG TFET). The mitigation technique for the data recovery after the heavy ion strike is discussed.
M. Pown, B. Lakshmi
doaj +1 more source
Biotropica, Volume 58, Issue 3, May 2026.Severe frost events seem to be happening on average every 5 years, rather than 7 years, as previously reported in the southern limit of the Cerrado, a Neotropical savanna. We conducted this study in the Cerrado, where severe frost events allowed us to compare fruit production and frugivorous bird abundance before and after the disturbance.
Mariana Campagnoli +2 more
wiley +1 more source
NEPP Update of Independent Single Event Upset Field Programmable Gate Array Testing [PDF]
, 2017 This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independent Single Event Upset (SEU) Field Programmable Gate Array (FPGA) testing including FPGA test guidelines, Microsemi RTG4 heavy-ion results, Xilinx Kintex ...
Campola, Michael +3 more
core +1 more source
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell [PDF]
, 2013 International audienceThis paper presents experimental characterization of the impact of negative bias temperature instability on the single-event upset sensitivity of SRAM cells embedded in a 65 nm CMOS test vehicle.
Perdu, Philippe +5 more
core +1 more source
The ecclesiastical fight against storm‐makers in the Latin west
Early Medieval Europe, Volume 34, Issue 2, Page 275-298, May 2026.This paper studies the strategies used by the Church to fight against the storm‐makers. These figures were said to cause the storms that ruined crops, and during Late Antiquity and the early Middle Ages in the Visigothic and Frankish kingdoms were subject to punishment and constraints.
Juan Antonio Jiménez Sánchez
wiley +1 more source
우주용 Shift Register의 Single Event Upset 분석에 관한 연구 [PDF]
, 2013 학위논문(석사) - 한국과학기술원 : 전기및전자공학과, 2013.2, [ vi, 54 p. ]In this paper, an analytic method of radiation effect of the shift register composed of the latch for space applications is presented.
Kang, Geun-Hun, 강근훈
core
Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC Microprocessors [PDF]
, 2004 This paper examines single-event upsets in advanced commercial SOI microprocessors in a dynamic mode, studying SEU sensitivity of General Purpose Registers (GPRs) with clock frequency.
Irom, Frokh +3 more
core
Single Event Mirroring and DRAM Sense Amplifier Designs for Improved Single-Event-Upset Performance [PDF]
, 2007 This paper proposes and investigates schemes for hardening the conventional CMOS cross-coupled DRAM sense amplifier to single event upset (SEU). These schemes, adapted from existing SRAM hardening techniques, are intended to harden the dynamic random ...
Lloyd W. Massengill +2 more
core
Nuclear Engineering and TechnologyThis paper investigates the Single Event Upset (SEU) sensitivity, system-level hardening effectiveness, and potential applications of high-performance 16 nm Field Programmable Gate Arrays (FPGAs) in radiation environments.
Chang Cai +11 more
doaj +1 more source
USING THE SOCHI STAND TO CONFIRM THE IMMATIBILITY OF THE INTEGRATED CIRCUIT
Безопасность информационных технологийThe paper analyzes the possible to apply of the SOCHI stand for the purpose of controlling the immutability of the chip`s topology in order trust (in reliable and safe operation).
Dmitry V. Bobrovsky +6 more
doaj +1 more source