Results 71 to 80 of about 962 (213)

Predicting On-Orbit Static Single Event Upset Rates in Xilinx Virtex FPGAs [PDF]

open access: yes, 2006
Sponsorship: Department of Energy, Los Alamos National Laboratory. This document describes the methodology used to predict single-event upset rates for Xilinx Virtex FPGAs based on the CREME96 orbit modeling tool.
Engel, Joshua   +3 more
core   +1 more source

Development and Deployment of the Smart Active Ionising Radiation at Altitude (SAIRA) Instruments for Space Weather Applications

open access: yesSpace Weather, Volume 24, Issue 6, June 2026.
Abstract This paper introduces the latest generation of airborne ionising radiation monitors, developed at the Surrey Space Centre (SSC) as part of the United Kingdom's (UK's) Space Weather Instrumentation, Measurement, Modeling and Risk (SWIMMR) program.
B. Clewer   +7 more
wiley   +1 more source

Characterization of System on a Chip (SoC) Single Event Upset (SEU) Responses Using SEU Data, Classical Reliability Models, and Space Environment Data [PDF]

open access: yes, 2017
We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment ...
Campola, Michael   +3 more
core   +1 more source

Ecological Niche Divergence in an Invasive Non‐Native Shrub: Implications for Risk Assessments

open access: yesAustral Ecology, Volume 51, Issue 6, June 2026.
The worldwide spread invasive shrub Nicotiana glauca (tree tobacco) underwent divergent niche shifts across two of its invaded regions. In the mediterranean region it presents high thermal seasonality and low thermal seasonality in the Caatinga (Brazil).
Fellipe Alves Ozorio do Nascimento   +4 more
wiley   +1 more source

Combined Time and Information Redundancy for SEU-Tolerance in Energy-Efficient Real-Time Systems [PDF]

open access: yes, 2006
Recently the trade-off between energy consumption and fault-tolerance in real-time systems has been highlighted. These works have focused on dynamic voltage scaling (DVS) to reduce dynamic energy dissipation and on time redundancy to achieve transient ...
Rosinger, Paul   +4 more
core  

Soft Error-Tolerant and Highly Stable Low-Power SRAM for Satellite Applications

open access: yesApplied Sciences
As CMOS technology has advanced, the transistor integration density of static random-access memory (SRAM) cells has increased. This has led to a reduction in the critical charge of sensitive nodes, making the SRAM cells more susceptible to soft errors ...
Jong-Yeob Oh, Sung-Hun Jo
doaj   +1 more source

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory [PDF]

open access: yes, 2017
We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode.
Ladbury, Raymond   +6 more
core   +1 more source

Bit Upset of 25 nm NAND Flash Memory Induced by Heavy Ion Irradiation

open access: yesYuanzineng kexue jishu, 2023
In order to investigate the influence of heavy ion fluence on single event upsets (SEU) and the SEU cross-section in NAND Flash memory, as well as the multiple-cell upsets (MCU) due to heavy ion irradiation, experimental studies were performed on two ...
SHENG Jiangkun1,2;XU Peng1,*;QIU Mengtong2;DING Lili2;LUO Yinhong2;YAO Zhibin2;ZHANG Fengqi2;GOU Shilong2;WANG Zujun2
doaj   +1 more source

Towards Geographies of Silence: Unspoken Boundaries

open access: yesTransactions of the Institute of British Geographers, Volume 51, Issue 2, June 2026.
ABSTRACT Despite its social and spatial significance, silence remains an under‐explored and under‐theorised subject in geography. This paper addresses this lacuna by examining silence as a boundary‐making practice in geographically distant relationships.
Dora Sampaio
wiley   +1 more source

Measurements of Single Event Upset in ATLAS IBL [PDF]

open access: yes, 2020
International audienceEffects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system.
Balbi, G.   +57 more
core   +1 more source

Home - About - Disclaimer - Privacy