Results 71 to 80 of about 264 (165)

Enhancement of Deep Neural Network Recognition on MPSoC with Single Event Upset. [PDF]

Micromachines (Basel), 2023
Yang W, Song W, Guo Y, Li Y, He C, Wu L, Wang B, Liu H, Shi G.   +8 more
europepmc   +1 more source

A High-Reliability 12T SRAM Radiation-Hardened Cell for Aerospace Applications. [PDF]

Micromachines (Basel), 2023
Yao R, Lv H, Zhang Y, Chen X, Zhang Y, Liu X, Bai G.   +6 more
europepmc   +1 more source

An SEU-Tolerant Cache for a RISC-V Core

Computers
The open RISC-V Instruction Set Architecture (ISA) is a versatile architecture with a growing number of implementations, including the aerospace sector, where tolerance to Single-Event Upset (SEU) faults is critical.
Ariel David Santana Gil, Salvador Ibarra Delgado, Julio Villalba Moreno, Remberto Sandoval Arechiga, Viktor Iván Rodriguez Abdalá, Manuel Hernández Calviño   +5 more
doaj   +1 more source

Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability

Information
This paper presents a register-transfer-level (RTL) fault injection study of the LEON3 processor’s internal memory subsystem under single-event upsets (SEUs). The analysis targets four key components: the instruction cache (I-cache), data cache (D-cache),
Afef Kchaou, Sehmi Saad, Hatem Garrab
doaj   +1 more source

A Radiation-Hardened Triple Modular Redundancy Design Based on Spin-Transfer Torque Magnetic Tunnel Junction Devices

Applied Sciences
Integrated circuits suffer severe deterioration due to single-event upsets (SEUs) in irradiated environments. Spin-transfer torque magnetic random-access memory (STT-MRAM) appears to be a promising candidate for next-generation memory as it shows ...
Shubin Zhang, Peifang Dai, Ning Li, Yanbo Chen   +3 more
doaj   +1 more source

Radiation-Hardened 20T SRAM with Read and Write Optimization for Space Applications

Applied Sciences
With continued CMOS scaling, transistor miniaturization has significantly raised SRAM integration density while lowering the critical charge (Qc), increasing cell vulnerability to spaceborne high-energy particles.
Kon-Woo Kim, Eun Gyo Jeong, Sung-Hun Jo
doaj   +1 more source

A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design. [PDF]

Micromachines (Basel), 2022
Yan A, Wei S, Chen Y, Fan Z, Huang Z, Cui J, Girard P, Wen X.   +7 more
europepmc   +1 more source

Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. [PDF]

Materials (Basel), 2023
Ellakany A, Zekry A, Zekry A, Abouelatta M, Shaker A, Sayah GT, El-Banna MM.   +6 more
europepmc   +1 more source

Effect of Total Dose Irradiation on Parasitic BJT in 130 nm PDSOI MOSFETs. [PDF]

Micromachines (Basel), 2023
Jia Y, Zhang Z, Bi D, Hu Z, Zou S.
europepmc   +1 more source

MRNG: Accessing Cosmic Radiation as an Entropy Source for a Non-Deterministic Random Number Generator. [PDF]

Entropy (Basel), 2023
Kutschera S, Slany W, Ratschiller P, Gursch S, Dagenborg H.   +4 more
europepmc   +1 more source