Predicting On-Orbit Static Single Event Upset Rates in Xilinx Virtex FPGAs [PDF]
Sponsorship: Department of Energy, Los Alamos National Laboratory. This document describes the methodology used to predict single-event upset rates for Xilinx Virtex FPGAs based on the CREME96 orbit modeling tool.
Engel, Joshua +3 more
core +1 more source
Abstract This paper introduces the latest generation of airborne ionising radiation monitors, developed at the Surrey Space Centre (SSC) as part of the United Kingdom's (UK's) Space Weather Instrumentation, Measurement, Modeling and Risk (SWIMMR) program.
B. Clewer +7 more
wiley +1 more source
Characterization of System on a Chip (SoC) Single Event Upset (SEU) Responses Using SEU Data, Classical Reliability Models, and Space Environment Data [PDF]
We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment ...
Campola, Michael +3 more
core +1 more source
Ecological Niche Divergence in an Invasive Non‐Native Shrub: Implications for Risk Assessments
The worldwide spread invasive shrub Nicotiana glauca (tree tobacco) underwent divergent niche shifts across two of its invaded regions. In the mediterranean region it presents high thermal seasonality and low thermal seasonality in the Caatinga (Brazil).
Fellipe Alves Ozorio do Nascimento +4 more
wiley +1 more source
Combined Time and Information Redundancy for SEU-Tolerance in Energy-Efficient Real-Time Systems [PDF]
Recently the trade-off between energy consumption and fault-tolerance in real-time systems has been highlighted. These works have focused on dynamic voltage scaling (DVS) to reduce dynamic energy dissipation and on time redundancy to achieve transient ...
Rosinger, Paul +4 more
core
Soft Error-Tolerant and Highly Stable Low-Power SRAM for Satellite Applications
As CMOS technology has advanced, the transistor integration density of static random-access memory (SRAM) cells has increased. This has led to a reduction in the critical charge of sensitive nodes, making the SRAM cells more susceptible to soft errors ...
Jong-Yeob Oh, Sung-Hun Jo
doaj +1 more source
Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory [PDF]
We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode.
Ladbury, Raymond +6 more
core +1 more source
Bit Upset of 25 nm NAND Flash Memory Induced by Heavy Ion Irradiation
In order to investigate the influence of heavy ion fluence on single event upsets (SEU) and the SEU cross-section in NAND Flash memory, as well as the multiple-cell upsets (MCU) due to heavy ion irradiation, experimental studies were performed on two ...
SHENG Jiangkun1,2;XU Peng1,*;QIU Mengtong2;DING Lili2;LUO Yinhong2;YAO Zhibin2;ZHANG Fengqi2;GOU Shilong2;WANG Zujun2
doaj +1 more source
Towards Geographies of Silence: Unspoken Boundaries
ABSTRACT Despite its social and spatial significance, silence remains an under‐explored and under‐theorised subject in geography. This paper addresses this lacuna by examining silence as a boundary‐making practice in geographically distant relationships.
Dora Sampaio
wiley +1 more source
Measurements of Single Event Upset in ATLAS IBL [PDF]
International audienceEffects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system.
Balbi, G. +57 more
core +1 more source

