Results 51 to 60 of about 962 (213)
ABSTRACT Aim To explore staff and patient perception of the newly co‐developed wearable monitoring system (WMS), including acceptability of use in clinical practice. Design Pragmatic qualitative descriptive study. Methods Semi‐structured interviews were conducted with 12 patient participants and eight staff members between June 2023 and August 2024 ...
Clare Edwards +5 more
wiley +1 more source
Single event upset hardening techniques [PDF]
Integrated circuit logic states are maintained by virtue of specific transistor combinations being either on'' (conducting) or off'' (nonconducting). High energy ion strikes on the microcircuit generate photocurrents whose primary detrimental effect is ...
Corbett, W. T., Weaver, H. T.
core
single-event upset in 3-D charge-trap NAND flash memories [PDF]
The effects of single-event upset (SEU) on the threshold voltage ( VT ) of a programmed cell in 3-D charge-trap (CT) NAND flash memory have been investigated using 3-D technology-computer-aided design (TCAD) simulations.
HAN, JIN-WOO +6 more
core +1 more source
Single event upset (SEU) has always been an important factor affecting the reliability of spacecraft electronic equipment, which can cause anomalies in electronic equipment in orbit, and can result in serious spacecraft failure. In order to master signal
ZHAO Zhendong;TAO Wenze;LI Yancun;CHENG Yi;ZHANG Qingxiang;AN Heng;QUAN Xiaoping;ZHANG Chenguang
doaj
Abstract Understanding a population's distribution depends on observing the presence and movement of individuals throughout their range. For highly mobile marine species, these observations typically rely on high effort monitoring programs. Tracking enough individuals to understand trends in movement behavior is not always logistically feasible, and ...
Abigail M. Kreuser +3 more
wiley +1 more source
A Stimulus-free Probabilistic Model for Single-Event-Upset Sensitivity [PDF]
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a growing concern in logic circuits. Accurate understanding and estimation of
core
Single event upset and mitigation technique in JLTFET based RF mixer
This work deals with the study of single event effect (SEE) on RF mixer along with the mitigation technique. A 20 nm independent gate Junctionless Tunnel FET JLTFET (IGJLTFET) was first designed and based on its Id-Vg characteristics; RF mixer circuit ...
Aishwarya K, Lakshmi B
doaj +1 more source
Abstract Results of laser-induced single event upset testing of devices with embedded error correction codes are described. Specifically, the memory system, consisting of a Micron MT41K256M16TW-107 IT: P 32 Meg×16×8 banks Dual Dynamic Random Access Memories (DDRs) was tested on a self-made test board. Two samples of each memory system or
Yang Han +4 more
openaire +1 more source
Abstract The planning, design and management of urban green and blue spaces necessitate trade‐offs between these spaces' many benefits and their drawbacks, but knowledge of perceived problems and unpleasant experiences in urban green and blue spaces remains limited.
Alyssa L. Solvie +5 more
wiley +1 more source
Statistical Reliability Estimation of Microprocessor-Based Systems [PDF]
What is the probability that the execution state of a given microprocessor running a given application is correct, in a certain working environment with a given soft-error rate?
A. Benso +16 more
core +1 more source

