Results 41 to 50 of about 962 (213)

Simulating Single Event Upset Rate with BERT [PDF]

, 1994
The circuit level modeling of single event effects is an area of on-giong research.
P. K. Ko, PAVAN, Paolo, C. Hu, E. Minami, R. Tu   +4 more
core  

Retrospective image analysis for long‐term demography using Google Earth imagery

Remote Sensing in Ecology and Conservation, EarlyView.
We demonstrate that high‐resolution Google Earth imagery, combined with minimal field validation, enables retrospective tracking of individual invasive plants. The image shows one of the monitored individuals of Opuntia sp. in Greece. Our approach reveals long‐term demographic patterns, recruitment dynamics, and spatial expansion without continuous ...
Erola Fenollosa, Garrett Cohen, Roberto Salguero‐Gómez   +2 more
wiley   +1 more source

Predication of Heavy Ion Single Event Upset Threshold and Cross Section Based on Low Energy Proton Test Data in Nanometer Devices

Yuanzineng kexue jishu
In order to ensure the reliability of heavy ion single event effect experimental data and the accuracy of space on-orbit single event error rate prediction, the research was conducted on the method of predicting the equivalent silicon layer thickness ...
LUO Yinhong, ZHANG Fengqi, WANG Tan, DING Lili, JIANG Xinshuai
doaj   +1 more source

Key Technical Fields and Future Outlooks of Space Manipulators: A Survey

SmartBot, EarlyView.
This paper systematically reviews the technological development of space manipulators, emphasizing the unique challenges posed by space environments. It examines four areas: structural design, modeling, planning, and control, while introducing typical ground test platforms.
Gang Chen, Zeyuan Huang, Ying Yan, Xiaokang An, Zhikai Zhao, Jirong Lin, Xiangrong Zhao, Xianyuan Gao, Junyi Zong, Xuewen Jia, Zhipeng Yao, Jianliang Liao, Ning Ji   +12 more
wiley   +1 more source

Técnicas de inyección de fallos basadas en FPGAs para la evaluación de la tolerancia a fallos de tipo SEU en circuitos digitales [PDF]

, 2007
Este trabajo de tesis doctoral presenta nuevas técnicas de inyección de fallos transitorios en elementos de memoria, que permiten la evaluación del comportamiento de los complejos circuitos digitales actuales en presencia de fallos SEU (Single Event ...
Portela García, Marta
core  

The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

Journal of Applied Science & Process Engineering, 2015
This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable
Norhuzaimin Julai
doaj   +1 more source

Hidden Losses: Assessing the Risk of Coextinction Among Ectoparasitic Flies and Their Bat Host Species in Brazil

Animal Conservation, EarlyView.
The potential impact of bat species extinction on the number of their ectoparasitic fly species, based on interaction data for Brazil. As bat host species are removed over time, more connected species (green) would experience steeper declines and lead to greater ectoparasite losses when compared to a random extinction model (gray).
Nathan Lorenzo de Sena Gotti, Jonathan Ramos Ribeiro, Eder Barbier, Enrico Bernard   +3 more
wiley   +1 more source

Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data [PDF]

, 2017
We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment ...
Campola, Michael, Berg, Melanie, Xapsos, Michael, Label, Kenneth   +3 more
core   +1 more source

Exploring the exploration: implications of leaving or remaining at the natal site during the early stages of independence in a partially migratory bird

Ibis, EarlyView.
Despite being an important fraction of any animal population, juveniles are a severely understudied group. Juveniles often need to learn an array of skills that allow them to survive independently and do so while undertaking decisions that may impact their fitness, recruitment and survival, having therefore relevant demographic implications.
Manuela S. Rodrigues, Afonso D. Rocha, João P. Silva, Carlos Carrapato, Jaime A. Ramos, Pedro M. Araújo, José A. Alves   +6 more
wiley   +1 more source

Towards a single event upset detector based on COTS FPGA [PDF]

, 2017
The Single Event Upset Detector (SEUD) is 3U CubeSat payload experiment that aims to achieve radiation tolerant computing through detection and correction of SEU bit flips on COTS SRAM FPGAs.
Ngo, Kalle,, Tage Mohammadat, Öberg, Johnny,, Mohammadat, Tage,, Johnny Oberg, Kalle Ngo   +5 more
core   +1 more source