Results 21 to 30 of about 8,001,430 (204)
Open Astronomy, 2023 The single event effect caused by space heavy ion radiation is one of the important factors affecting the safety and operation of spacecraft on orbit.
Zhang Binquan +10 more
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Double Node Upset Immune RHBD-14T SRAM Cell for Space and Satellite Applications
IEEE Access, 2023 Deep sub-micron memory devices play a crucial role in space electronic applications due to their susceptibility to single-event upset and double-node upset types of soft errors. When a charged particle from space hit a scaled memory circuit, the critical
Pavan Kumar Mukku, Rohit Lorenzo
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Radiation Hardened NULL Convention Logic Asynchronous Circuit Design
Journal of Low Power Electronics and Applications, 2015 This paper proposes a radiation hardened NULL Convention Logic (NCL) architecture that can recover from a single event latchup (SEL) or single event upset (SEU) fault without deadlock or any data loss.
Liang Zhou, Scott C. Smith, Jia Di
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Nantong Daxue xuebao. Ziran kexue ban, 2020 With the wide application of FPGA(field programmable gate array) based on the SRAM(static randomaccess memory) in the aerospace field, the probability of SEU(single event upset) increases gradually while the FPGAs are exposed in irradiation environment ...
XIE Da;DONG Yiping;WANG Lan;CAO Jinde;GUO Junjie
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Energy and angular dependence of single event upsets in ESA SEU Monitor
Acta Physica Sinica, 2016 The new generation ESA SEU Monitor is first applied to beam verification of Beijing HI-13 Tandem accelerator according to the popularization need of Europe Space Agency and at the desire of contrast of domestic acceleraor with international accelerator.
null Luo Yin-Hong +4 more
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Microprocessor Technology and Single Event Upset Susceptibility [PDF]
, 1996 Today\u27s small satellites employ powerful microcircuits to control virtually every aspect of the spacecraft. While these small devices are very capable, they are increasingly vulnerable to heavy ion induced Single Event Upset (SEU).
Akers, L.D.
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Applied SciencesIn space environments, radiation particles affect the stored values of SRAM cells, and these effects, such as single-event upsets (SEUs) and single-event multiple-node upsets (SEMNUs), pose a threat to the reliability of systems used in the space ...
Hong-Geun Park, Sung-Hun Jo
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On the design of two single event tolerant slave latches for scan delay testing [PDF]
, 2012 This paper proposes two new slave latches for improving the Single Event Upset (SEU) tolerance of a flip- flop in scan delay testing. The two proposed slave latches utilize additional circuitry to increase the critical charge of the flip-flop compared to
Lu Y, Pontarelli S, Lombardi F, Ottavi M
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Nuclear Engineering and Technology, 2017 Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems.
T.S. Nidhin +4 more
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NI Based System for Seu Testing of Memory Chips for Avionics
MATEC Web of Conferences, 2016 This paper presents the results of implementation of National Instrument based system for Single Event Upset testing of memory chips into neutron generator experimental facility, which used for SEU tests for avionics purposes. Basic SEU testing algorithm
Boruzdina Anna +3 more
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