Results 21 to 30 of about 962 (213)
Determination of the Sensitive Volume and Critical Charge for Induction of SEU in Nanometer SRAMs [PDF]
فصلنامه علوم و فناوری فضایی, 2023 In this paper, the sensitive volume and critical charge of a 65-nm CMOS SRAM as two important quantities in Single Event Upset (SEU) calculations have been determined. SEU is the most common event in space investigations.
Gholamreza Raisali +2 more
doaj +1 more source
FAUST: fault-injection script-based tool [PDF]
, 2003 The tool described in this paper aims at evaluating the effectiveness of software-implemented fault-tolerant techniques used in safety-critical systems. The target application is stressed with the injection of transient or permanent faults.
Di Natale, Giorgio +5 more
core +1 more source
Double Node Upset Immune RHBD-14T SRAM Cell for Space and Satellite Applications
IEEE Access, 2023 Deep sub-micron memory devices play a crucial role in space electronic applications due to their susceptibility to single-event upset and double-node upset types of soft errors. When a charged particle from space hit a scaled memory circuit, the critical
Pavan Kumar Mukku, Rohit Lorenzo
doaj +1 more source
Microprocessor Technology and Single Event Upset Susceptibility [PDF]
, 1996 Today\u27s small satellites employ powerful microcircuits to control virtually every aspect of the spacecraft. While these small devices are very capable, they are increasingly vulnerable to heavy ion induced Single Event Upset (SEU).
Akers, L.D.
core +2 more sources
Radiation Hardened NULL Convention Logic Asynchronous Circuit Design
Journal of Low Power Electronics and Applications, 2015 This paper proposes a radiation hardened NULL Convention Logic (NCL) architecture that can recover from a single event latchup (SEL) or single event upset (SEU) fault without deadlock or any data loss.
Liang Zhou, Scott C. Smith, Jia Di
doaj +1 more source
Physical Mechanisms Inducing Electron Single-Event Upset [PDF]
, 2018 International audienceWith the increase of sensitivity of devices to single-event upsets (SEUs), the possibility to trigger an upset with incident electrons has been recently raised.
C. Inguimbert +13 more
core +1 more source
IEEE Transactions on Circuits and Systems I: Regular Papers, 2023 Low Density Parity Check (LDPC) codes are used in 5G systems for traffic channels due to their excellent error correction capability for long sequences, and the Min-Sum algorithm is widely applied in practical implementations of LDPC decoders due to its low complexity.
Zhen Gao 0005 +4 more
openaire +2 more sources
Energy and angular dependence of single event upsets in ESA SEU Monitor
Acta Physica Sinica, 2016 The new generation ESA SEU Monitor is first applied to beam verification of Beijing HI-13 Tandem accelerator according to the popularization need of Europe Space Agency and at the desire of contrast of domestic acceleraor with international accelerator.
null Luo Yin-Hong +4 more
openaire +1 more source
Single-event-upset-like fault injection: a comprehensive framework [PDF]
, 2005 INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0018-9499International audienceAn approach to reproduce radiation ground testing results for the study of microprocessors vulnerability to single event upset (SEU) is described in this ...
Faure, F., Velazco, Raoul, Peronnard, P.
core +1 more source
Nantong Daxue xuebao. Ziran kexue ban, 2020 With the wide application of FPGA(field programmable gate array) based on the SRAM(static randomaccess memory) in the aerospace field, the probability of SEU(single event upset) increases gradually while the FPGAs are exposed in irradiation environment ...
XIE Da;DONG Yiping;WANG Lan;CAO Jinde;GUO Junjie
doaj +1 more source