Results 101 to 110 of about 10,587 (214)

Single Event Upset Study of 22 nm Fully Depleted Silicon-on-Insulator Static Random Access Memory with Charge Sharing Effect. [PDF]

Micromachines (Basel), 2023
Yin C, Gao T, Wei H, Chen Y, Liu H.
europepmc   +1 more source

Shortcomings in ground testing, environment simulations, and performance predictions for space applications [PDF]

This paper addresses the issues involved in radiation testing of devices and subsystems to obtain the data that are required to predict the performance and survivability of satellite systems for extended missions in space.
Brucker, G. J., Stassinopoulos, E. G.
core   +1 more source

Enhancement of Deep Neural Network Recognition on MPSoC with Single Event Upset. [PDF]

Micromachines (Basel), 2023
Yang W, Song W, Guo Y, Li Y, He C, Wu L, Wang B, Liu H, Shi G.   +8 more
europepmc   +1 more source

A High-Reliability 12T SRAM Radiation-Hardened Cell for Aerospace Applications. [PDF]

Micromachines (Basel), 2023
Yao R, Lv H, Zhang Y, Chen X, Zhang Y, Liu X, Bai G.   +6 more
europepmc   +1 more source

A Radiation-Hardened Triple Modular Redundancy Design Based on Spin-Transfer Torque Magnetic Tunnel Junction Devices

Applied Sciences
Integrated circuits suffer severe deterioration due to single-event upsets (SEUs) in irradiated environments. Spin-transfer torque magnetic random-access memory (STT-MRAM) appears to be a promising candidate for next-generation memory as it shows ...
Shubin Zhang, Peifang Dai, Ning Li, Yanbo Chen   +3 more
doaj   +1 more source

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update [PDF]

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing ...
Berg, Melanie D., LaBel, Kenneth A.
core   +1 more source

Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability

Information
This paper presents a register-transfer-level (RTL) fault injection study of the LEON3 processor’s internal memory subsystem under single-event upsets (SEUs). The analysis targets four key components: the instruction cache (I-cache), data cache (D-cache),
Afef Kchaou, Sehmi Saad, Hatem Garrab
doaj   +1 more source

Radiation-Hardened 20T SRAM with Read and Write Optimization for Space Applications

Applied Sciences
With continued CMOS scaling, transistor miniaturization has significantly raised SRAM integration density while lowering the critical charge (Qc), increasing cell vulnerability to spaceborne high-energy particles.
Kon-Woo Kim, Eun Gyo Jeong, Sung-Hun Jo
doaj   +1 more source

The effects of high energy particles on planetary missions [PDF]

Researchers review the background and motivation for the detailed study of the variability and uncertainty of the particle environment from a space systems planning perspective. The engineering concern raised by each environment is emphasized rather than
Robinson, Paul A., Jr.
core   +1 more source

Working group written presentation: Trapped radiation effects [PDF]

The results of the Trapped Radiation Effects Panel for the Space Environmental Effects on Materials Workshop are presented. The needs of the space community for new data regarding effects of the space environment on materials, including electronics are ...
Coulter, D., Friebele, E. J., Hand, K. J., Hardy, D. A., Higby, P., Kolasinski, W. A., Santoro, R. T., Stuckey, Wayne K., Tompkins, Stephen S., Vampola, Alfred L.   +9 more
core   +1 more source