Results 111 to 120 of about 7,396,207 (304)
T. Kato et al., "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization With Neutrons and Alpha Particles," in IEEE Transactions on Nuclear Science, vol. 68, no. 7, pp.
黒木, 貴志, クロキ, タカシ
core
Comparing the paths of Hedgehog release in artificial and natural settings
Hh morphogens require solubilization factors to overcome their tight association with the plasma membrane and signal to distant cells, but the precise functions of these factors are controversial. Here, we use published in vivo observations as the most relevant evidence to test their suggested functions and discuss contradictions and gaps between in ...
Janna Puschmann, Kay Grobe
wiley +1 more source
Single-Event Upsets in Microelectronics: Fundamental Physics and Issues
We review the current understanding of single-event upsets (SEUs) in microelectronic devices. In recent years, SEUs have been recognized as one of the key reliability concerns for both current and future technologies.
Henry H.K. Tang, Kenneth P. Rodbell
core +1 more source
How structural disorder and polyelectrolyte properties of prothymosin α enable its large interactome
In this review, complexes of the fully disordered and highly negatively charged prothymosin α are collected, described, and discussed. Linked to its poly‐electrostatic character, prothymosin α engages a large interactome through multiple different binding modes ranging from fully disordered complexes to short linear motif (SLiM)‐driven interactions ...
Ketty C. Tamburrini +3 more
wiley +1 more source
Combined Time and Information Redundancy for SEU-Tolerance in Energy-Efficient Real-Time Systems
Recently the trade-off between energy consumption and fault-tolerance in real-time systems has been highlighted. These works have focused on dynamic voltage scaling (DVS) to reduce dynamic energy dissipation and on time redundancy to achieve transient ...
Rosinger, Paul +4 more
core +1 more source
This paper presents a register-transfer-level (RTL) fault injection study of the LEON3 processor’s internal memory subsystem under single-event upsets (SEUs). The analysis targets four key components: the instruction cache (I-cache), data cache (D-cache),
Afef Kchaou, Sehmi Saad, Hatem Garrab
doaj +1 more source
Which brain hemisphere controls writing? This review synthesizes all five functional transcranial Doppler studies of writing (handwriting and typing) published to date in adults and children. Right‐handers show left‐hemispheric dominance for the linguistic component of writing (written word generation), whereas findings for left‐handers remain ...
Marietta Papadatou‐Pastou
wiley +1 more source
Estimation of SEU Threshold Energy from Kitsat-1 Data Using AP-8 Model [PDF]
KITSAT-1, launched in 1992, passes through Inner Van Allen Radiation Belt in which high energy protons cause single event upsets(SEUs) in the main memory of KITSAT-1 OBC(On-Board Computer)186.
Sung-Joon Kim +3 more
doaj
Bias and Threshold-Voltage Dependencies of Single-Event Upsets in a 7-Nm Bulk FinFET Technology
In this work, single-event upset responses of D flip-flop designs with different threshold-voltage options in a 7-nm bulk FinFET technology are examined.
D'Amico IV, Joseph Vincent
core
Mitochondrial translation and coordinated cytosolic translation in metabolic homeostasis and disease
Mitochondrial function depends on coordinated protein production from the nuclear and mitochondrial genomes. This review highlights how cytosolic and mitochondrial translation, mRNA localization, protein import, and respiratory complex assembly are integrated to maintain mitochondrial proteostasis and function.
Boseon Kim +4 more
wiley +1 more source

