Results 201 to 210 of about 260 (218)
Some of the next articles are maybe not open access.

Prevention of Single Event Upsets in Microelectronics

1991
B. L. Bhuva   +4 more
openaire   +1 more source

Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs

IEEE Transactions on Nuclear Science, 2015
Ronald Schrimpf   +2 more
exaly  

Study Of Single-event-upsets In PAL16R8

1993 IEEE Radiation Effects Data Workshop, 2005
J. Barak   +7 more
openaire   +1 more source

Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

IEEE Transactions on Nuclear Science, 2011
S ‐J Wen, T D Loveless, B L Bhuva
exaly  

Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits

IEEE Transactions on Nuclear Science, 2009
Kenneth Rodbell
exaly  

TDRS-1 single event upsets and the effect of the space environment

IEEE Transactions on Nuclear Science, 1991
exaly  

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