Results 211 to 218 of about 260 (218)
Some of the next articles are maybe not open access.
Bias dependence of muon-induced single event upsets in 28 nm static random access memories
2014Adrian Hillier +2 more
exaly
Design of polarity hardening SRAM for mitigating single event multiple node upsets
Wenjuan Lu, Zhiting Lin, Xiulong Wuexaly
Single event upset hardened latch
2004HAZUCHA PETER, SOUMYANATH KRISHNAMURTHY
openaire +2 more sources
Single Event Upset Mitigation for Electronic Design Synthesis
2013PLATZKER DANIEL +2 more
openaire +3 more sources

