Results 91 to 100 of about 6,338 (277)
COST EFFECTIVE SOFT ERROR MITIGATION IN MICROPROCESSORS
Device scaling has caused the challenges that processor designers face to evolve sig-nificantly in the past. This trend will continue into the future, and reliability is emerging as a significant challenge.
Sanjay J. Patel, Ph. D, Nicholas J. Wang
core
Radiation-induced single bit upsets (SBUs) and multi-bit upsets (MBUs) are more prominent in Field Programmable Gate Arrays (FPGAs) due to the presence of a large number of latches in the configuration memory (CM) of FPGAs.
Chattopadhyay S. +4 more
core +1 more source
Deep neural networks (DNNs) are being incorporated in resource-constrained IoT devices, which typically rely on reduced memory footprint and low-performance processors. While DNNs' precision and performance can vary and are essential, it is also vital to
Ricardo Reis (181591) +4 more
core +1 more source
Interfacial charge transfer and low‐resistance interphase formation between PEO‐based polymer and Li10GeP2S12 solid electrolytes are investigated using multi‐electrode impedance spectroscopy and advanced analytical techniques such as XPS and ToF‐SIMS.
Ujjawal Sigar +6 more
wiley +1 more source
An intentionally added, chemically formed LixAlSy coating stabilizes the lithium–electrolyte interface in solid‐state Li–S batteries. The layer suppresses side reactions, preserves smooth charge transfer, and improves ion transport from the start. This approach offers a practical route to more durable solid‐state batteries and a clearer understanding ...
Xinyi Wang +4 more
wiley +1 more source
Influence of Carbon Nanoparticles on Electrically Induced Wear of Grease‐Lubricated Steels
When an electric current enters a pair of rubbing surfaces, enormous damage takes place. In this research, how such damage occurs in the presence of protective grease and the mitigation with added carbon nanoparticles, were investigated. It was discovered that those particles regulate transport and interfacial electrical stability of the grease ...
Mohammad Humaun Kabir +6 more
wiley +1 more source
Cosmic radiation resulting in transient faults to the combinational logic of Integrated Circuits (ICs), constitutes a major reliability concern for space applications.
Georgakidis C., Paliaroutis G.I., Sketopoulos N., Tsoumanis P., Sotiriou C., Evmorfopoulos N., Stamoulis G.
core +1 more source
Interface‐Engineered Binary Framework Composites: Advancing Porous Materials for Precision Medicine
Binary framework composites integrate two complementary porous architectures into a unified platform, enabling multifunctional design, enhanced structural tunability, and improved physicochemical performance. By combining high surface area, ordered porosity, interfacial synergy, and versatile functionalization, these hybrid materials offer new ...
Navid Rabiee +3 more
wiley +1 more source
Analysis of Soft Error Mitigation Techniques for
— Soft errors are a major reliability concern for today’s nanometer technologies. The errors in register files in Application Specific Integrated Circuits (ASIC) can quickly spread to various parts of the system and result in data corruption which may go
Register Files, Ibm Cu- Technology
core
Xenes for Sustainable Energy: A Roadmap From First‐Principles Design to Practical Deployment
Emerging 2D Xenes are advancing from theoretical predictions toward practical energy‐storage and conversion technologies through the integration of first‐principles modelling, experimental synthesis, electrochemical validation, and AI‐assisted materials design, enabling accelerated discovery of high‐performance and sustainable electrochemical systems ...
Onur Karaman, Ceren Karaman
wiley +1 more source

