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Applying Reinforcement Learning to Protect Deep Neural Networks from Soft Errors [PDF]

Sensors
With the advance of Artificial Intelligence, Deep Neural Networks are widely employed in various sensor-based systems to analyze operational conditions.
Peng Su, Yuhang Li, Zhonghai Lu, Dejiu Chen   +3 more
doaj   +2 more sources

FRESH: Fully Reliable and Effective Protection Against Soft and Hard Errors

IEEE Access
Advances in modern computing systems have led to an unprecedented spread of safety-critical applications in real-world environments. In safety-critical applications, preventing malfunctions due to faults is a primary design concern, as malfunctions in ...
Daehoon Son, Hwisoo So, Jinhyo Jung, Yohan Ko, Aviral Shrivastava, Kyoungwoo Lee   +5 more
doaj   +2 more sources

Design and control of a novel pneumatic soft robot based on the improved particle swarm optimization algorithm. [PDF]

PLoS ONE
Inspired by the flexible structures found in soft organisms in nature, researchers have developed a variety of novel soft robots using flexible materials.
Hongjun Meng, Changbao Zhou, Xingbo Yang, Peiqi Zhao, Wei Zhang   +4 more
doaj   +2 more sources

Experimental Study on the Space Electrostatic Discharge Effect and the Single Event Effect of SRAM Devices for Satellites

Applied Sciences, 2022
Space Electrostatic Discharge Effect (SESD) and Single Event Effect (SEE) are two major space environmental factors that cause spacecraft failure. Previous studies have established that both can lead to soft errors such as upset of memory cells.
Xuan Wang, Rui Chen, Runjie Yuan, Qian Chen, Yanan Liang, Jianwei Han   +5 more
doaj   +1 more source

Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node

Applied Sciences, 2022
Fully Depleted Silicon on Insulator (FD SOI) technology nodes provide better resistance to single event upsets than comparable bulk technologies, but upsets are still likely to occur at nano-scale feature sizes, and additional hardening techniques should
Christopher J. Elash, Zongru Li, Chen Jin, Li Chen, Jiesi Xing, Zhiwu Yang, Shuting Shi   +6 more
doaj   +1 more source

Soft Error Tolerant Count Min Sketches [PDF]

IEEE Transactions on Computers, 2021
The estimation of the frequency of the elements on a set is needed in a wide range of computing applications. For example, to estimate the number of hits that a video gets or the number of packets in a network flow. In some cases, the number of elements in the set is very large and it is not practical to maintain a table with the exact count for each ...
Pedro Reviriego, Jorge Martinez, Marco Ottavi   +2 more
openaire   +3 more sources

SRAM Cell Design Challenges in Modern Deep Sub-Micron Technologies: An Overview

Micromachines, 2022
Microprocessors use static random-access memory (SRAM) cells in the cache memory design. As a part of the central computing component, their performance is critical.
Waqas Gul, Maitham Shams, Dhamin Al-Khalili   +2 more
doaj   +1 more source

Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

Sensors, 2021
Aerospace equipages encounter potential radiation footprints through which soft errors occur in the memories onboard. Hence, robustness against radiation with reliability in memory cells is a crucial factor in aerospace electronic systems.
Bharathi Raj Muthu, Ewins Pon Pushpa, Vaithiyanathan Dhandapani, Kamala Jayaraman, Hemalatha Vasanthakumar, Won-Chun Oh, Suresh Sagadevan   +6 more
doaj   +1 more source

SEDAR: Soft Error Detection and Automatic Recovery in High Performance Computing Systems

Journal of Computer Science and Technology, 2020
Reliability and fault tolerance have become aspects of growing relevance in the field of HPC, due to the increased probability that faults of different kinds will occur in these systems.
Diego Montezanti
doaj   +1 more source

Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning

Jurnal Nasional Teknik Elektro, 2022
Soft errors from radiations can change the data in electronic devices especially memory cells such as in TCAMs. The soft errors cause bit-flip errors that makes the data are corrupted in the network.
Infall Syafalni, Trio Adiono
doaj   +1 more source